Electronic properties for the C 2v and C s isomers of Pr@C 82 studied by Raman, resistivity and scanning tunneling microscopy/spectroscopy

Tomoko Hosokawa, Satoshi Fujiki, Eiji Kuwahara, Yoshihiro Kubozono, Hiroshi Kitagawa, Akihiko Fujiwara, Taishi Takenobu, Yoshihiro Iwasa

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Electronic properties of the major and minor isomers of Pr@C 82, I (C 2v) and II (C s), are studied by Raman scattering, resistivity measurement, scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS). The valences of the Pr atom in both isomers are determined to be +3 based on the Raman shift in the Pr-C 82 stretching mode. The transport properties showed that both isomers are normal semiconductors with a small energy gap (E g). STM of isomer I shows internal structures dependent on bias voltage V s, and STS shows that this isomer is a semiconductor with E g = 0.7 eV.

Original languageEnglish
Pages (from-to)78-81
Number of pages4
JournalChemical Physics Letters
Volume395
Issue number1-3
DOIs
Publication statusPublished - 2004 Sep 1
Externally publishedYes

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Scanning tunneling microscopy
Isomers
Electronic properties
scanning tunneling microscopy
isomers
Spectroscopy
electrical resistivity
electronics
spectroscopy
Energy gap
Semiconductor materials
Scanning
scanning
Bias voltage
Transport properties
Stretching
Raman scattering
transport properties
Raman spectra
valence

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Atomic and Molecular Physics, and Optics

Cite this

Electronic properties for the C 2v and C s isomers of Pr@C 82 studied by Raman, resistivity and scanning tunneling microscopy/spectroscopy. / Hosokawa, Tomoko; Fujiki, Satoshi; Kuwahara, Eiji; Kubozono, Yoshihiro; Kitagawa, Hiroshi; Fujiwara, Akihiko; Takenobu, Taishi; Iwasa, Yoshihiro.

In: Chemical Physics Letters, Vol. 395, No. 1-3, 01.09.2004, p. 78-81.

Research output: Contribution to journalArticle

Hosokawa, T, Fujiki, S, Kuwahara, E, Kubozono, Y, Kitagawa, H, Fujiwara, A, Takenobu, T & Iwasa, Y 2004, 'Electronic properties for the C 2v and C s isomers of Pr@C 82 studied by Raman, resistivity and scanning tunneling microscopy/spectroscopy', Chemical Physics Letters, vol. 395, no. 1-3, pp. 78-81. https://doi.org/10.1016/j.cplett.2004.07.072
Hosokawa, Tomoko ; Fujiki, Satoshi ; Kuwahara, Eiji ; Kubozono, Yoshihiro ; Kitagawa, Hiroshi ; Fujiwara, Akihiko ; Takenobu, Taishi ; Iwasa, Yoshihiro. / Electronic properties for the C 2v and C s isomers of Pr@C 82 studied by Raman, resistivity and scanning tunneling microscopy/spectroscopy. In: Chemical Physics Letters. 2004 ; Vol. 395, No. 1-3. pp. 78-81.
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AU - Fujiki, Satoshi

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AU - Kubozono, Yoshihiro

AU - Kitagawa, Hiroshi

AU - Fujiwara, Akihiko

AU - Takenobu, Taishi

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