Energy distribution of traps in polyethersulfone film estimated through surface potential measurements

Shengtao Li, Hengkun Xie, Yoshimichi Ohki

Research output: Contribution to conferencePaper

3 Citations (Scopus)

Abstract

In this paper, surface potential of polyethersulfone film was measured as a function of time for the samples which had been short-circuited for various periods. A new model has been proposed to connect the surface potential with the energy distribution of traps inside the insulating polymers.

Original languageEnglish
Pages113-116
Number of pages4
Publication statusPublished - 1996 Dec 1
Externally publishedYes
EventProceedings of Joint Conference: 1996 Asian International Conference on Dielectrics & Electrical Insulation Diagnosis, 96'AICDEI & 4th-JCCEID - Xi'an, China
Duration: 1996 Oct 81996 Oct 11

Other

OtherProceedings of Joint Conference: 1996 Asian International Conference on Dielectrics & Electrical Insulation Diagnosis, 96'AICDEI & 4th-JCCEID
CityXi'an, China
Period96/10/896/10/11

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Energy distribution of traps in polyethersulfone film estimated through surface potential measurements'. Together they form a unique fingerprint.

  • Cite this

    Li, S., Xie, H., & Ohki, Y. (1996). Energy distribution of traps in polyethersulfone film estimated through surface potential measurements. 113-116. Paper presented at Proceedings of Joint Conference: 1996 Asian International Conference on Dielectrics & Electrical Insulation Diagnosis, 96'AICDEI & 4th-JCCEID, Xi'an, China, .