Enhancement of sensitivity for the evaluation of electrical properties by modifying the nano structure of microwave AFM probe

Lan Zhang, Yang Ju, Atsushi Hosoi, Akifumi Fujimoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To confirm the sensitivity in the measurement of electrical properties affected by the nano structure of microwave AFM (M-AFM) probe, three kinds of M-AFM probe with a nano-slit on its tip in different width (75 nm, 120 nm and 160 nm) were investigated. Au and glass samples were measured by the probes working at a non-contact AFM mode. The M-AFM probe with the nano-slit having the width of 75 nm, by which the difference of the measured voltage between Au and glass samples is 55.1 mV, shows the highest sensitivity for detecting electrical properties of materials. As the result illustrated, the M-AFM probe with smaller width nano-slit on the tip can be considered to be an ideal nano structure.

Original languageEnglish
Title of host publicationMaterials Science Forum
Pages555-558
Number of pages4
Volume675 677
DOIs
Publication statusPublished - 2011
Externally publishedYes
Event7th International Forum on Advanced Material Science and Technology, IFAMST-7 - Dalian
Duration: 2010 Jun 262010 Jun 28

Publication series

NameMaterials Science Forum
Volume675 677
ISSN (Print)02555476

Other

Other7th International Forum on Advanced Material Science and Technology, IFAMST-7
CityDalian
Period10/6/2610/6/28

Fingerprint

Electric properties
electrical properties
Microwaves
atomic force microscopy
microwaves
augmentation
evaluation
probes
sensitivity
slits
Glass
glass
Electric potential
electric potential

Keywords

  • Atomic force microscope
  • Electrical properties
  • Microwave
  • Nanotechnology

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Zhang, L., Ju, Y., Hosoi, A., & Fujimoto, A. (2011). Enhancement of sensitivity for the evaluation of electrical properties by modifying the nano structure of microwave AFM probe. In Materials Science Forum (Vol. 675 677, pp. 555-558). (Materials Science Forum; Vol. 675 677). https://doi.org/10.4028/www.scientific.net/MSF.675-677.555

Enhancement of sensitivity for the evaluation of electrical properties by modifying the nano structure of microwave AFM probe. / Zhang, Lan; Ju, Yang; Hosoi, Atsushi; Fujimoto, Akifumi.

Materials Science Forum. Vol. 675 677 2011. p. 555-558 (Materials Science Forum; Vol. 675 677).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhang, L, Ju, Y, Hosoi, A & Fujimoto, A 2011, Enhancement of sensitivity for the evaluation of electrical properties by modifying the nano structure of microwave AFM probe. in Materials Science Forum. vol. 675 677, Materials Science Forum, vol. 675 677, pp. 555-558, 7th International Forum on Advanced Material Science and Technology, IFAMST-7, Dalian, 10/6/26. https://doi.org/10.4028/www.scientific.net/MSF.675-677.555
Zhang, Lan ; Ju, Yang ; Hosoi, Atsushi ; Fujimoto, Akifumi. / Enhancement of sensitivity for the evaluation of electrical properties by modifying the nano structure of microwave AFM probe. Materials Science Forum. Vol. 675 677 2011. pp. 555-558 (Materials Science Forum).
@inproceedings{f8894a7894b746cfb659893225684339,
title = "Enhancement of sensitivity for the evaluation of electrical properties by modifying the nano structure of microwave AFM probe",
abstract = "To confirm the sensitivity in the measurement of electrical properties affected by the nano structure of microwave AFM (M-AFM) probe, three kinds of M-AFM probe with a nano-slit on its tip in different width (75 nm, 120 nm and 160 nm) were investigated. Au and glass samples were measured by the probes working at a non-contact AFM mode. The M-AFM probe with the nano-slit having the width of 75 nm, by which the difference of the measured voltage between Au and glass samples is 55.1 mV, shows the highest sensitivity for detecting electrical properties of materials. As the result illustrated, the M-AFM probe with smaller width nano-slit on the tip can be considered to be an ideal nano structure.",
keywords = "Atomic force microscope, Electrical properties, Microwave, Nanotechnology",
author = "Lan Zhang and Yang Ju and Atsushi Hosoi and Akifumi Fujimoto",
year = "2011",
doi = "10.4028/www.scientific.net/MSF.675-677.555",
language = "English",
isbn = "9783037850497",
volume = "675 677",
series = "Materials Science Forum",
pages = "555--558",
booktitle = "Materials Science Forum",

}

TY - GEN

T1 - Enhancement of sensitivity for the evaluation of electrical properties by modifying the nano structure of microwave AFM probe

AU - Zhang, Lan

AU - Ju, Yang

AU - Hosoi, Atsushi

AU - Fujimoto, Akifumi

PY - 2011

Y1 - 2011

N2 - To confirm the sensitivity in the measurement of electrical properties affected by the nano structure of microwave AFM (M-AFM) probe, three kinds of M-AFM probe with a nano-slit on its tip in different width (75 nm, 120 nm and 160 nm) were investigated. Au and glass samples were measured by the probes working at a non-contact AFM mode. The M-AFM probe with the nano-slit having the width of 75 nm, by which the difference of the measured voltage between Au and glass samples is 55.1 mV, shows the highest sensitivity for detecting electrical properties of materials. As the result illustrated, the M-AFM probe with smaller width nano-slit on the tip can be considered to be an ideal nano structure.

AB - To confirm the sensitivity in the measurement of electrical properties affected by the nano structure of microwave AFM (M-AFM) probe, three kinds of M-AFM probe with a nano-slit on its tip in different width (75 nm, 120 nm and 160 nm) were investigated. Au and glass samples were measured by the probes working at a non-contact AFM mode. The M-AFM probe with the nano-slit having the width of 75 nm, by which the difference of the measured voltage between Au and glass samples is 55.1 mV, shows the highest sensitivity for detecting electrical properties of materials. As the result illustrated, the M-AFM probe with smaller width nano-slit on the tip can be considered to be an ideal nano structure.

KW - Atomic force microscope

KW - Electrical properties

KW - Microwave

KW - Nanotechnology

UR - http://www.scopus.com/inward/record.url?scp=79952563513&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79952563513&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/MSF.675-677.555

DO - 10.4028/www.scientific.net/MSF.675-677.555

M3 - Conference contribution

SN - 9783037850497

VL - 675 677

T3 - Materials Science Forum

SP - 555

EP - 558

BT - Materials Science Forum

ER -