Error analysis of optoelectronic frequency response measurement of photodiodes using high-extinction ratio Mach-Zehnder modulator

Keizo Inagaki, Ukrit Mankong, Tetsuya Kawanishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We analyze the errors of a newly proposed measurement method on optoelectronic frequency response of photodiodes, which uses a high-extinction ratio Mach-Zehnder modulator to generate a two-tone stimulus lightwave. Five major error factors are identified and analyzed quantitatively. The result shows that the evaluated combined uncertainty is expected to be less than 0.5 dB.

Original languageEnglish
Title of host publicationProceedings - ICOCN 2012: 2012 11th International Conference on Optical Communications and Networks
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event2012 11th International Conference on Optical Communications and Networks, ICOCN 2012 - Chonburi, Thailand
Duration: 2012 Nov 282012 Nov 30

Other

Other2012 11th International Conference on Optical Communications and Networks, ICOCN 2012
CountryThailand
CityChonburi
Period12/11/2812/11/30

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Keywords

  • Error analysis
  • Frequency response
  • Heterodyne principle
  • Mach-Zehnder modulator
  • Photo-diode

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Communication

Cite this

Inagaki, K., Mankong, U., & Kawanishi, T. (2012). Error analysis of optoelectronic frequency response measurement of photodiodes using high-extinction ratio Mach-Zehnder modulator. In Proceedings - ICOCN 2012: 2012 11th International Conference on Optical Communications and Networks [6486225] https://doi.org/10.1109/ICOCN.2012.6486225