Estimation of delay test quality and its application to test generation

Seiji Kajihara*, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)


As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM, the following two things are important: for each transition fault, (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method not only derives more accurate SDQL (Statistical Delay Quality Level) but also enhances the test quality of generated test patterns.

Original languageEnglish
Title of host publication2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Number of pages5
Publication statusPublished - 2007
Externally publishedYes
Event2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States
Duration: 2007 Nov 42007 Nov 8

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152


Conference2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Country/TerritoryUnited States
CitySan Jose, CA

ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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