Estimation of delay test quality and its application to test generation

Seiji Kajihara*, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM, the following two things are important: For each transition fault, (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method improves SDQL (Statistical Delay Quality Level) by not only accurate calculation of the longest sensitizable paths but also detection of faults through longer paths.

Original languageEnglish
Pages (from-to)104-115
Number of pages12
JournalIPSJ Transactions on System LSI Design Methodology
Publication statusPublished - 2008 Aug
Externally publishedYes

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering


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