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Estimation of delay test quality and its application to test generation
Seiji Kajihara*, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
9
Citations
(Scopus)