Estimation of surface excitation correction factor for 200-5000 eV in Ni from absolute elastic scattering electron spectroscopy

S. Tanuma, Shingo Ichimura, K. Goto

Research output: Contribution to journalConference article

69 Citations (Scopus)

Abstract

We have determined the surface plasmon excitation correction (SEC) factor for nickel in the 200-5000 eV range from the ratios of the absolute elastic scattering electron intensities measured by a novel cylindrical mirror analyzer and those by the Monte Carlo method. The inelastic mean free paths (IMFPs) of nickel used for the Monte Carlo method in the energy range specified were calculated by the Penn algorithm. The resulting SECs were smaller than the values calculated from Chen and Oswald general equations of surface excitation parameters (SEPs), which describe the influence of surface plasmon excitations by electrons crossing a solid surface. We also found that SEPs (obtained from SECs) could be fitted to the equation Ps(α, E) = C/[En cos(α)+C] or Ps(α, E) = aE-b/cos(α) (<7% root-mean-square error) in the 200-5000 eV energy range, where Ps is the SEP, α is the surface crossing angle of the electron to the surface normal, n(= 0.41), C(= 5.39), a(= 1.7) and b(= 0.29) are parameters and E is the electron energy.

Original languageEnglish
Pages (from-to)212-216
Number of pages5
JournalSurface and Interface Analysis
Volume30
Issue number1
DOIs
Publication statusPublished - 2000 Aug 1
Externally publishedYes
Event8th European Conference on Applications of Surface and Interface Analisys, ECASIA 99 - Sevilla, Spain
Duration: 1999 Oct 41999 Oct 8

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Elastic scattering
Electron spectroscopy
electron spectroscopy
elastic scattering
excitation
Electrons
Nickel
Monte Carlo method
nickel
Monte Carlo methods
electron flux density
root-mean-square errors
solid surfaces
mean free path
analyzers
Mean square error
electrons
Mirrors
electron energy
mirrors

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Estimation of surface excitation correction factor for 200-5000 eV in Ni from absolute elastic scattering electron spectroscopy. / Tanuma, S.; Ichimura, Shingo; Goto, K.

In: Surface and Interface Analysis, Vol. 30, No. 1, 01.08.2000, p. 212-216.

Research output: Contribution to journalConference article

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N2 - We have determined the surface plasmon excitation correction (SEC) factor for nickel in the 200-5000 eV range from the ratios of the absolute elastic scattering electron intensities measured by a novel cylindrical mirror analyzer and those by the Monte Carlo method. The inelastic mean free paths (IMFPs) of nickel used for the Monte Carlo method in the energy range specified were calculated by the Penn algorithm. The resulting SECs were smaller than the values calculated from Chen and Oswald general equations of surface excitation parameters (SEPs), which describe the influence of surface plasmon excitations by electrons crossing a solid surface. We also found that SEPs (obtained from SECs) could be fitted to the equation Ps(α, E) = C/[En cos(α)+C] or Ps(α, E) = aE-b/cos(α) (<7% root-mean-square error) in the 200-5000 eV energy range, where Ps is the SEP, α is the surface crossing angle of the electron to the surface normal, n(= 0.41), C(= 5.39), a(= 1.7) and b(= 0.29) are parameters and E is the electron energy.

AB - We have determined the surface plasmon excitation correction (SEC) factor for nickel in the 200-5000 eV range from the ratios of the absolute elastic scattering electron intensities measured by a novel cylindrical mirror analyzer and those by the Monte Carlo method. The inelastic mean free paths (IMFPs) of nickel used for the Monte Carlo method in the energy range specified were calculated by the Penn algorithm. The resulting SECs were smaller than the values calculated from Chen and Oswald general equations of surface excitation parameters (SEPs), which describe the influence of surface plasmon excitations by electrons crossing a solid surface. We also found that SEPs (obtained from SECs) could be fitted to the equation Ps(α, E) = C/[En cos(α)+C] or Ps(α, E) = aE-b/cos(α) (<7% root-mean-square error) in the 200-5000 eV energy range, where Ps is the SEP, α is the surface crossing angle of the electron to the surface normal, n(= 0.41), C(= 5.39), a(= 1.7) and b(= 0.29) are parameters and E is the electron energy.

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