Evaluation Criterion for Determining Turn-to-Turn Contact Electrical Resistance Satisfying High Thermal Stability and Shortening Charging Delay in NI-REBCO Coils for MRIs

Yuka Yoshihara*, Mai Hamanaka, Kyoka Tsuyoshi, Mayu Kitamura, Ui Nemoto, So Noguchi, Atsushi Ishiyama

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

We have been developing a no-insulation (NI) coil technology to achieve high thermal stability and high current density. NI coils can continue to operate even if a part of the coils degrades; however, a charging delay occurs in the coils. Moreover, the turn-to-turn contact electrical resistance of the NI coils must be increased to shorten the charging delay; however, a large turn-to-turn contact electrical resistance reduces thermal stability. In this study, using turn-to-turn contact electrical resistance and IOP/IC ratios as parameters, we analyze thermal stability and consider the possibility that NI coils can continue to operate even if they have local defects. Furthermore, to establish an evaluation criterion for determining turn-to-turn contact electrical resistance that can shorten charging delay and ensure high thermal stability, we analyze and evaluate the relationship between turn-to-turn contact electrical resistance and thermal stability, focusing on three types of heat generation.

Original languageEnglish
Article number9381674
JournalIEEE Transactions on Applied Superconductivity
Volume31
Issue number5
DOIs
Publication statusPublished - 2021 Aug

Keywords

  • Defect
  • REBCO coil
  • no-insulation
  • thermal stability
  • turn-to-turn contact electrical resistance

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Evaluation Criterion for Determining Turn-to-Turn Contact Electrical Resistance Satisfying High Thermal Stability and Shortening Charging Delay in NI-REBCO Coils for MRIs'. Together they form a unique fingerprint.

Cite this