Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz

Naoko Ono, Kyoya Takano, Mizuki Motoyoshi, Kosuke Katayama, Minoru Fujishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The accuracy of de-embedding techniques depending on de-embedding layout patterns has been verified by experiment up to 110 GHz for CMOS circuits. The accuracy of the measured characteristics is affected significantly by the de-embedding procedure, which has been done for the raw measurement data. The de-embedding patterns and some transmission lines (TL) as test device were designed and fabricated using 40 nm CMOS process. From the experiment results, it was confirmed that each characteristic of the TL, such as propagation constant and characteristic impedance, has a different suitable de-embedding pattern to set a reference plane at a different desired position.

Original languageEnglish
Title of host publicationEuropean Microwave Week 2012
Subtitle of host publication"Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012
Pages548-551
Number of pages4
Publication statusPublished - 2012
Externally publishedYes
Event7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012 - Amsterdam, Netherlands
Duration: 2012 Oct 292012 Oct 30

Other

Other7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012
CountryNetherlands
CityAmsterdam
Period12/10/2912/10/30

Fingerprint

Electric lines
Networks (circuits)
Experiments

Keywords

  • de-embed
  • millimeter wave technology
  • reference plane
  • transmission lines
  • W band

ASJC Scopus subject areas

  • Hardware and Architecture

Cite this

Ono, N., Takano, K., Motoyoshi, M., Katayama, K., & Fujishima, M. (2012). Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. In European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012 (pp. 548-551). [6483858]

Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. / Ono, Naoko; Takano, Kyoya; Motoyoshi, Mizuki; Katayama, Kosuke; Fujishima, Minoru.

European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012. 2012. p. 548-551 6483858.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ono, N, Takano, K, Motoyoshi, M, Katayama, K & Fujishima, M 2012, Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. in European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012., 6483858, pp. 548-551, 7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012, Amsterdam, Netherlands, 12/10/29.
Ono N, Takano K, Motoyoshi M, Katayama K, Fujishima M. Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. In European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012. 2012. p. 548-551. 6483858
Ono, Naoko ; Takano, Kyoya ; Motoyoshi, Mizuki ; Katayama, Kosuke ; Fujishima, Minoru. / Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012. 2012. pp. 548-551
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