Evaluation of degradation in polyimide by recovery voltage measurement

A. Yamaguchi, W. Wei, Naoshi Hirai, Yoshimichi Ohki, E. Zaima, S. Okabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Polyimide (PI) has been widely used for insulation in motors, integrated circuits, electric wire, cable, and so on, due to its high mechanical strength, thermal stability, chemical stability, and radiation resistance. We have examined the degradation of API (all-aromatic polyimide) and TPI (thermoplastic polyimide) soaked in H 2O or KOH by measuring recovery voltage. The peak value of the recovery voltage was found to depend on the soaking time. We have developed a theoretical equation of recovery voltage, and have found that the peak value of recovery voltage is a function of the dielectric constant. By measuring the recovery voltage, it is possible to diagnose the degradation of API and TPI.

Original languageEnglish
Title of host publicationConference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
Pages216-220
Number of pages5
Publication statusPublished - 2001
Event2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Kitchener, ON, Canada
Duration: 2001 Oct 142001 Oct 17

Other

Other2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena
CountryCanada
CityKitchener, ON
Period01/10/1401/10/17

Fingerprint

Voltage measurement
Polyimides
Recovery
Degradation
Electric potential
Thermoplastics
Electric wire
Chemical stability
Strength of materials
Integrated circuits
Insulation
Cables
Thermodynamic stability
Permittivity
Radiation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Building and Construction

Cite this

Yamaguchi, A., Wei, W., Hirai, N., Ohki, Y., Zaima, E., & Okabe, S. (2001). Evaluation of degradation in polyimide by recovery voltage measurement. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report (pp. 216-220)

Evaluation of degradation in polyimide by recovery voltage measurement. / Yamaguchi, A.; Wei, W.; Hirai, Naoshi; Ohki, Yoshimichi; Zaima, E.; Okabe, S.

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. 2001. p. 216-220.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yamaguchi, A, Wei, W, Hirai, N, Ohki, Y, Zaima, E & Okabe, S 2001, Evaluation of degradation in polyimide by recovery voltage measurement. in Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. pp. 216-220, 2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Kitchener, ON, Canada, 01/10/14.
Yamaguchi A, Wei W, Hirai N, Ohki Y, Zaima E, Okabe S. Evaluation of degradation in polyimide by recovery voltage measurement. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. 2001. p. 216-220
Yamaguchi, A. ; Wei, W. ; Hirai, Naoshi ; Ohki, Yoshimichi ; Zaima, E. ; Okabe, S. / Evaluation of degradation in polyimide by recovery voltage measurement. Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. 2001. pp. 216-220
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