Evaluation of KEK n-in-p planar pixel sensor structures for very high radiation environments with testbeam

K. Motohashi, T. Kubota, K. Nakamura, R. Hori, C. Gallrapp, Y. Unno, O. Jinnouchi, S. Altenheiner, Y. Arai, M. Hagihara, M. Backhaus, M. Bomben, D. Forshaw, M. George, K. Hanagaki, K. Hara, M. Hirose, Y. Ikegami, N. Ishijima, J. JentzschK. Kawagoe, N. Kimura, T. Kono, A. MacChiolo, R. Nishimura, S. Oda, H. Otono, I. Rubinskiy, A. Rummler, R. Takashima, Y. Takubo, J. J. Teoh, S. Terada, K. Todome, J. Tojo, J. Usui, P. Weigell, J. Weingarten, D. Yamaguchi, K. Yorita

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