Evaluation of microcell CDMA system in consideration of Intercell correlation

Manabu Kawabe, Takuro Sato, Toshio Kato, Atsushi Fukasawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In the CDMA, the inter-symbol interference by the other user between cells must be taken into consideration in addition to the distance in evaluating the interference. The inter-symbol interference analysis and evaluation by simulation have been carried out for each combination. The inter-symbol interference was analyzed for each direction of the reverse and forward links. As a result, it has been found that the m-sequence code as intracell spreading code are better than the Gold code for the multiple cell structure, in the case of the reverse link. In the forward link, on the other hand, the interferences in the cell and between cells have been found to be reduced by using the orthogonal code in each cell and the m-sequence code as the intercell spreading code.

Original languageEnglish
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
PublisherPubl by IEEE
Pages2224-2227
Number of pages4
ISBN (Print)0780312813
Publication statusPublished - 1993 Jan 1
Externally publishedYes
EventProceedings of the 1993 IEEE International Symposium on Circuits and Systems - Chicago, IL, USA
Duration: 1993 May 31993 May 6

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume4
ISSN (Print)0271-4310

Other

OtherProceedings of the 1993 IEEE International Symposium on Circuits and Systems
CityChicago, IL, USA
Period93/5/393/5/6

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Kawabe, M., Sato, T., Kato, T., & Fukasawa, A. (1993). Evaluation of microcell CDMA system in consideration of Intercell correlation. In Proceedings - IEEE International Symposium on Circuits and Systems (pp. 2224-2227). (Proceedings - IEEE International Symposium on Circuits and Systems; Vol. 4). Publ by IEEE.