Evaluation of soft errors in DRAM and SRAM using nuclear microprobe and neutron source

M. Takai, Y. Arita, S. Abo, T. Iwamatsu, S. Maegawa, H. Sayama, Y. Yamaguchi, M. Inuishi, T. Nishimura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Engineering & Materials Science