Evaluation of temperature and germanium concentration dependence of EXAFS oscillations in Si-rich silicon germanium thin films

K. Yoshioka, R. Yokogawa, M. Koharada, H. Takeuchi, G. Ogasawara, I. Hirosawa, T. Watanabe, A. Ogura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Engineering & Materials Science