Evaluation of temperature dependence and lifetime of 79GHz power amplifier

Chen Yang Li, Takeshi Yoshida, Kosuke Katayama, Mizuki Motoyoshi, Kyoya Takano, Shuhei Amakawa, Minoru Fujishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A 79 GHz power amplifier (PA) using 4-stages common-source structure is presented in this paper. To evaluate temperature dependence of circuit characteristics, the PA is measured at various temperatures. At room temperature (RT) and 100°C, the saturated output power is 7.6 and 7.1dBm, the maximum PAE is 6.2% and 4.9%, respectively. The reliability and lifetime of PA is also obtained. To the author's knowledge, this is the first paper to show the lifetime results of PA at two different biases in 40nm CMOS process.

Original languageEnglish
Title of host publicationIMFEDK 2013 - 2013 International Meeting for Future of Electron Devices, Kansai
Pages100-101
Number of pages2
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event2013 11th International Meeting for Future of Electron Devices, Kansai, IMFEDK 2013 - Osaka, Japan
Duration: 2013 Jun 52013 Jun 6

Other

Other2013 11th International Meeting for Future of Electron Devices, Kansai, IMFEDK 2013
CountryJapan
CityOsaka
Period13/6/513/6/6

Fingerprint

Power amplifiers
Temperature
Networks (circuits)

Keywords

  • CMOS
  • lifetime of PA
  • millimeter-wave
  • power amplifier
  • temperature dependence

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Li, C. Y., Yoshida, T., Katayama, K., Motoyoshi, M., Takano, K., Amakawa, S., & Fujishima, M. (2013). Evaluation of temperature dependence and lifetime of 79GHz power amplifier. In IMFEDK 2013 - 2013 International Meeting for Future of Electron Devices, Kansai (pp. 100-101). [6602258] https://doi.org/10.1109/IMFEDK.2013.6602258

Evaluation of temperature dependence and lifetime of 79GHz power amplifier. / Li, Chen Yang; Yoshida, Takeshi; Katayama, Kosuke; Motoyoshi, Mizuki; Takano, Kyoya; Amakawa, Shuhei; Fujishima, Minoru.

IMFEDK 2013 - 2013 International Meeting for Future of Electron Devices, Kansai. 2013. p. 100-101 6602258.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Li, CY, Yoshida, T, Katayama, K, Motoyoshi, M, Takano, K, Amakawa, S & Fujishima, M 2013, Evaluation of temperature dependence and lifetime of 79GHz power amplifier. in IMFEDK 2013 - 2013 International Meeting for Future of Electron Devices, Kansai., 6602258, pp. 100-101, 2013 11th International Meeting for Future of Electron Devices, Kansai, IMFEDK 2013, Osaka, Japan, 13/6/5. https://doi.org/10.1109/IMFEDK.2013.6602258
Li CY, Yoshida T, Katayama K, Motoyoshi M, Takano K, Amakawa S et al. Evaluation of temperature dependence and lifetime of 79GHz power amplifier. In IMFEDK 2013 - 2013 International Meeting for Future of Electron Devices, Kansai. 2013. p. 100-101. 6602258 https://doi.org/10.1109/IMFEDK.2013.6602258
Li, Chen Yang ; Yoshida, Takeshi ; Katayama, Kosuke ; Motoyoshi, Mizuki ; Takano, Kyoya ; Amakawa, Shuhei ; Fujishima, Minoru. / Evaluation of temperature dependence and lifetime of 79GHz power amplifier. IMFEDK 2013 - 2013 International Meeting for Future of Electron Devices, Kansai. 2013. pp. 100-101
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