Evaluation of the coherence of electron beam from low temperature field emitter

Wataru Kobayashi, B. Cho, T. Ishikawa, E. Rokuta, C. Oshima

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Multi-walled carbon nanotubes (MWCNT) have been known to function as nano-biprism in projection microscope. Here we measure the transverse coherence length (Lt) of electron beam (e-beam) from tungsten field emitter by using the nano-biprism. A MWCNT is irradiated by an e-beam radially propagating from a field emitter and its magnified image is projected on the screen. Tip approach enlarges the image and beautiful interference patterns always show up as shown in Fig.1 and Fig.2. With decreasing the source temperature from RT to 78K, the visibility of the interference fringe increases by a factor of 3, and the band width of interference pattern widens by a factor of 5. This enhancement of coherence with temperature fall strongly suggests the direct relationship between the coherences of electronic state1 inside the field emitter and e-beam. Now we are preparing experiments at liquid helium temperature with conventional tungsten tips and superconducting niobium tips, which will provide further enhancement of the coherence of e-beam.

    Original languageEnglish
    Title of host publicationIVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings
    Pages283
    Number of pages1
    Publication statusPublished - 2004
    EventIVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings - Beijing
    Duration: 2004 Sep 62004 Sep 10

    Other

    OtherIVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings
    CityBeijing
    Period04/9/604/9/10

    Fingerprint

    Electron beams
    Temperature distribution
    Tungsten
    Carbon nanotubes
    Niobium
    Visibility
    Temperature
    Helium
    Microscopes
    Bandwidth
    Liquids
    Experiments

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Kobayashi, W., Cho, B., Ishikawa, T., Rokuta, E., & Oshima, C. (2004). Evaluation of the coherence of electron beam from low temperature field emitter. In IVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings (pp. 283)

    Evaluation of the coherence of electron beam from low temperature field emitter. / Kobayashi, Wataru; Cho, B.; Ishikawa, T.; Rokuta, E.; Oshima, C.

    IVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings. 2004. p. 283.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Kobayashi, W, Cho, B, Ishikawa, T, Rokuta, E & Oshima, C 2004, Evaluation of the coherence of electron beam from low temperature field emitter. in IVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings. pp. 283, IVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings, Beijing, 04/9/6.
    Kobayashi W, Cho B, Ishikawa T, Rokuta E, Oshima C. Evaluation of the coherence of electron beam from low temperature field emitter. In IVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings. 2004. p. 283
    Kobayashi, Wataru ; Cho, B. ; Ishikawa, T. ; Rokuta, E. ; Oshima, C. / Evaluation of the coherence of electron beam from low temperature field emitter. IVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings. 2004. pp. 283
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