Fingerprint
Dive into the research topics of 'Evolution of Defect Structures and Deep Subgap States during Annealing of Amorphous In-Ga-Zn Oxide for Thin-Film Transistors'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Evolution of Defect Structures and Deep Subgap States during Annealing of Amorphous In-Ga-Zn Oxide for Thin-Film Transistors
Junjun Jia, Ayaka Suko, Yuzo Shigesato*, Toshihiro Okajima, Keiko Inoue, Hiroyuki Hosomi
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
22
Citations
(Scopus)