Evolution of Defect Structures and Deep Subgap States during Annealing of Amorphous In-Ga-Zn Oxide for Thin-Film Transistors

Junjun Jia, Ayaka Suko, Yuzo Shigesato*, Toshihiro Okajima, Keiko Inoue, Hiroyuki Hosomi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)

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Physics & Astronomy