Excitonic recombination radiation as characterization of diamonds using cathodoluminescence

H. Kawarada, A. Yamaguchi

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Free-exciton and bound-exciton recombination radiation has been investigated for the characterization of crystal quality and dopants in natural high pressure synthetic and chemically vapour-deposited diamonds using cathodoluminescence. In the limited areas where the growth conditions are optimized, distinct emissions of free-exciton recombination have been observed even in polycrystalline diamond or in crystals formed in nitrogen-rich conditions. The emission is useful for local estimation of crystal purity. Bound-exciton recombination radiation reflects the acceptor concentration in homoepitaxial boron-doped films. The emissions are dominant in the range 1.8-5.5 eV.

Original languageEnglish
Pages (from-to)100-105
Number of pages6
JournalDiamond and Related Materials
Volume2
Issue number2-4
DOIs
Publication statusPublished - 1993 Mar 31

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Mechanical Engineering
  • Physics and Astronomy(all)
  • Materials Chemistry
  • Electrical and Electronic Engineering

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