Excitonic recombination radiation as characterization of diamonds using cathodoluminescence

H. Kawarada, A. Yamaguchi

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    14 Citations (Scopus)

    Abstract

    Free-exciton and bound-exciton recombination radiation has been investigated for the characterization of crystal quality and dopants in natural high pressure synthetic and chemically vapour-deposited diamonds using cathodoluminescence. In the limited areas where the growth conditions are optimized, distinct emissions of free-exciton recombination have been observed even in polycrystalline diamond or in crystals formed in nitrogen-rich conditions. The emission is useful for local estimation of crystal purity. Bound-exciton recombination radiation reflects the acceptor concentration in homoepitaxial boron-doped films. The emissions are dominant in the range 1.8-5.5 eV.

    Original languageEnglish
    Pages (from-to)100-105
    Number of pages6
    JournalDiamond and Related Materials
    Volume2
    Issue number2 -4 pt 1
    Publication statusPublished - 1993 Jan 1

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    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Materials Chemistry
    • Surfaces, Coatings and Films
    • Surfaces and Interfaces

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