Experimental determination of equivalent oxide thickness of gate insulators

Atsushi Hiraiwa, Satoshi Sakai, Dai Ishikawa, Masatoshi Nakazawa

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Fingerprint Dive into the research topics of 'Experimental determination of equivalent oxide thickness of gate insulators'. Together they form a unique fingerprint.

Physics & Astronomy