Experimental Evaluation of Wavelength-Dependence of Thin-Film LiNbO3 Modulator with an Extinction-Ratio-Tunable Structure

Yuya Yamaguchi, Atsushi Kanno, Naokatsu Yamamoto, Tetsuya Kawanishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigate the operation of a thin-film lithium niobite modulator with specific focus on the wavelength dependence. For a precise evaluation of the modulation distortion, we used an extinction-ratio-tunable-type modulator.

Original languageEnglish
Title of host publicationOECC/PSC 2019 - 24th OptoElectronics and Communications Conference/International Conference Photonics in Switching and Computing 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9784885523212
DOIs
Publication statusPublished - 2019 Jul
Event24th OptoElectronics and Communications Conference/International Conference Photonics in Switching and Computing, OECC/PSC 2019 - Fukuoka, Japan
Duration: 2019 Jul 72019 Jul 11

Publication series

NameOECC/PSC 2019 - 24th OptoElectronics and Communications Conference/International Conference Photonics in Switching and Computing 2019

Conference

Conference24th OptoElectronics and Communications Conference/International Conference Photonics in Switching and Computing, OECC/PSC 2019
CountryJapan
CityFukuoka
Period19/7/719/7/11

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Keywords

  • Optical modulators

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Signal Processing
  • Electrical and Electronic Engineering
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Yamaguchi, Y., Kanno, A., Yamamoto, N., & Kawanishi, T. (2019). Experimental Evaluation of Wavelength-Dependence of Thin-Film LiNbO3 Modulator with an Extinction-Ratio-Tunable Structure. In OECC/PSC 2019 - 24th OptoElectronics and Communications Conference/International Conference Photonics in Switching and Computing 2019 [8818043] (OECC/PSC 2019 - 24th OptoElectronics and Communications Conference/International Conference Photonics in Switching and Computing 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/PS.2019.8818043