Experimental observation on the Fermi level shift in polycrystalline Al-doped ZnO films

Junjun Jia, Aiko Takasaki, Nobuto Oka, Yuzo Shigesato

Research output: Contribution to journalArticle

61 Citations (Scopus)

Abstract

The shift of the Fermi level in polycrystalline aluminum doped zinc oxide (AZO) films was studied by investigating the carrier density dependence of the optical band gap and work function. The optical band gap showed a positive linear relationship with the two-thirds power of carrier density n e 2 / 3. The work function ranged from 4.56 to 4.73 eV and showed a negative linear relationship with n e 2 / 3. These two phenomena are well explained on the basis of Burstein-Moss effect by considering the nonparabolic nature of the conduction band, indicating that the shift of Fermi level exhibits a nonparabolic nature of the conduction band for the polycrystalline AZO film. The variation of work function with the carrier density reveals that the shift of the surface Fermi level can be tailored by the carrier density in the polycrystalline AZO films. The controllability between the work function and the carrier density in polycrystalline AZO films offers great potential advantages in the development of optoelectronic devices.

Original languageEnglish
Article number013718
JournalJournal of Applied Physics
Volume112
Issue number1
DOIs
Publication statusPublished - 2012 Jul 1
Externally publishedYes

Fingerprint

zinc oxides
oxide films
shift
aluminum
conduction bands
Bryophytes
controllability
optoelectronic devices
Fermi surfaces

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Experimental observation on the Fermi level shift in polycrystalline Al-doped ZnO films. / Jia, Junjun; Takasaki, Aiko; Oka, Nobuto; Shigesato, Yuzo.

In: Journal of Applied Physics, Vol. 112, No. 1, 013718, 01.07.2012.

Research output: Contribution to journalArticle

Jia, Junjun ; Takasaki, Aiko ; Oka, Nobuto ; Shigesato, Yuzo. / Experimental observation on the Fermi level shift in polycrystalline Al-doped ZnO films. In: Journal of Applied Physics. 2012 ; Vol. 112, No. 1.
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