Expert system for quality diagnosis of glass films on silicon steels

Harutoshi Ogai, Takatugu Ueyama, Hiroshi Sato, Yoichi Mishima, Shinichi Itonaga

Research output: Contribution to journalArticle

Abstract

Knowledge acqusition and modification methods are described for building a quality diagnosis expert system. Knowledge of a quality diagnosis expert is represented in tabular form. The final quality properties are predicted from the operating conditions of the intermediate process and compared with the target values. A pattern of deviations of the final quality properties from the target values is summarized in a table. The practical application of this procedure and the architecture and human interface of a silicon steel glass film quality diagnosis expert system are described.

Original languageEnglish
Pages (from-to)173-181
Number of pages9
JournalISIJ International
Volume30
Issue number2
Publication statusPublished - 1990
Externally publishedYes

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Silicon steel
Expert systems
Glass

ASJC Scopus subject areas

  • Metals and Alloys

Cite this

Ogai, H., Ueyama, T., Sato, H., Mishima, Y., & Itonaga, S. (1990). Expert system for quality diagnosis of glass films on silicon steels. ISIJ International, 30(2), 173-181.

Expert system for quality diagnosis of glass films on silicon steels. / Ogai, Harutoshi; Ueyama, Takatugu; Sato, Hiroshi; Mishima, Yoichi; Itonaga, Shinichi.

In: ISIJ International, Vol. 30, No. 2, 1990, p. 173-181.

Research output: Contribution to journalArticle

Ogai, H, Ueyama, T, Sato, H, Mishima, Y & Itonaga, S 1990, 'Expert system for quality diagnosis of glass films on silicon steels', ISIJ International, vol. 30, no. 2, pp. 173-181.
Ogai H, Ueyama T, Sato H, Mishima Y, Itonaga S. Expert system for quality diagnosis of glass films on silicon steels. ISIJ International. 1990;30(2):173-181.
Ogai, Harutoshi ; Ueyama, Takatugu ; Sato, Hiroshi ; Mishima, Yoichi ; Itonaga, Shinichi. / Expert system for quality diagnosis of glass films on silicon steels. In: ISIJ International. 1990 ; Vol. 30, No. 2. pp. 173-181.
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