Extremely durable CD-ROM with a novel structure

H. Yamaguchi, Y. Tsukamoto, F. Watanabe, A. Sato, Mikiko Saito, H. Honda, M. Murahata, M. Yanagisawa, Toshio Tsuno

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)


This paper describes an extremely durable CD-ROM and its reliability. A pit pattern was fabricated through a sol-gel process utilizing a 2P/epoxy work stamper. Excellent stability was guaranteed by a layered structure, such as the SiO2-ZrO2 overcoat on a chemical strengthening glass substrate and the Si/SiO2-ZrO2/Cr tri-layered reflector on a sol-gel layer. Accelerated tests were implemented to estimate its lifetime. The CD-ROM lifetime at 30°C and 90% RH was estimated to be more than 300 years. This exceedingly long lifetime was determined on the basis of the following two experimental results. Little degradation was observed in Cl error rate during about 50 days at 120°C and 90% RH. A main degradation mode, which was observed on longer aging, was Cr film peeling-off. It was found that activation energy for the Cr peeling-off process was 0.91 eV by an in-situ peeling detection tester, based on the acoustic emission method.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Place of PublicationBellingham, WA, United States
PublisherPubl by Int Soc for Optical Engineering
Number of pages10
ISBN (Print)0819406082
Publication statusPublished - 1991
Externally publishedYes
EventOptical Data Storage '91 - Colorado Springs, CO, USA
Duration: 1991 Feb 251991 Feb 27


OtherOptical Data Storage '91
CityColorado Springs, CO, USA


ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Yamaguchi, H., Tsukamoto, Y., Watanabe, F., Sato, A., Saito, M., Honda, H., Murahata, M., Yanagisawa, M., & Tsuno, T. (1991). Extremely durable CD-ROM with a novel structure. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1499, pp. 29-38). Publ by Int Soc for Optical Engineering.