Fabrication and physical properties of double perovskite SrLaVMoO 6 thin films

H. Matsushima*, H. Gotoh, T. Miyawaki, K. Ueda, H. Asano

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

SrLaVMoO6 thin films have been grown on various substrates by magnetron sputtering in ArH2 mixture gas. High-quality c-axis oriented SrLaVMoO6 films have been obtained in the growth temperature of 630 C and Ar 5 H2 mixture gas. The SrLaVMoO6 films showed low resistive metallic behavior, which is comparable to bulk SrLaVMoO6. X-ray photoemission spectroscopy measurements indicate that the dominant valence state for Mo and V in the SrLaVMoO6 films is tetravalent (Mo4) and trivalent state (V3), respectively.

Original languageEnglish
Article number07E321
JournalJournal of Applied Physics
Volume109
Issue number7
DOIs
Publication statusPublished - 2011 Apr 1
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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