Fabrication of MgAl 2O 4 thin films on ferromagnetic heusler Alloy Fe 2CrSi by reactive magnetron sputtering

Naoto Fukatani*, Keima Inagaki, Kenichiro Mari, Hirohito Fujita, Tetsuta Miyawaki, Kenji Ueda, Hidefumi Asano

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Epitaxial MgAl 2O 4 thin films were grown on Heusler alloy Fe 2CrSi by reactive magnetron sputtering of a MgAl 2 target in an O 2+Ar atmosphere. To grow MgAl 2O 4 on Fe 2CrSi, we inserted a protective layer of MgAl 2 between Fe 2CrSi and MgAl 2O 4 to prevent Fe 2CrSi from being oxidized. Growth of MgAl 2O 4 was found to be very sensitive to the MgAl 2 thickness and PO 2 during deposition of MgAl 2O 4. A strong XRD peak of MgAl 2O 4 (004) was observed with an ultrathin (0.2 nm) MgAl 2 layer. The saturation magnetic moment of Fe 2CrSi was measured to be 370 emu/cm 3 (1.84μB/f.u.) at room temperature and it is expected to have a high spin polarization. The Fe 2CrSi/ MgAl 2O 4 heterostructure is promising for use in future spintronic devices.

Original languageEnglish
Article number02BM04
JournalJapanese journal of applied physics
Volume51
Issue number2 PART 2
DOIs
Publication statusPublished - 2012 Feb
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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