Fast physical random bit generation with photonic integrated circuits with different external cavity lengths for chaos generation

Rie Takahashi, Yasuhiro Akizawa, Atsushi Uchida, Takahisa Harayama, Ken Tsuzuki, Satoshi Sunada, Kenichi Arai, Kazuyuki Yoshimura, Peter Davis

Research output: Contribution to journalArticle

38 Citations (Scopus)

Abstract

We generate random bit sequences from chaotic temporal waveforms by using photonic integrated circuits (PICs) with different external cavity lengths. We investigate the condition for generating random bits at different sampling rates of single-bit generation method with the PICs. We succeed in generating certified random bit sequences by using the PIC with 3, 4, 5, or 10-mm-long external cavity, whereas random bits cannot pass all the statistical tests of randomness when the PIC with 1 or 2 mm-long external cavity is used.

Original languageEnglish
Pages (from-to)11727-11740
Number of pages14
JournalOptics Express
Volume22
Issue number10
DOIs
Publication statusPublished - 2014
Externally publishedYes

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integrated circuits
chaos
photonics
cavities
statistical tests
waveforms
sampling

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Fast physical random bit generation with photonic integrated circuits with different external cavity lengths for chaos generation. / Takahashi, Rie; Akizawa, Yasuhiro; Uchida, Atsushi; Harayama, Takahisa; Tsuzuki, Ken; Sunada, Satoshi; Arai, Kenichi; Yoshimura, Kazuyuki; Davis, Peter.

In: Optics Express, Vol. 22, No. 10, 2014, p. 11727-11740.

Research output: Contribution to journalArticle

Takahashi, R, Akizawa, Y, Uchida, A, Harayama, T, Tsuzuki, K, Sunada, S, Arai, K, Yoshimura, K & Davis, P 2014, 'Fast physical random bit generation with photonic integrated circuits with different external cavity lengths for chaos generation', Optics Express, vol. 22, no. 10, pp. 11727-11740. https://doi.org/10.1364/OE.22.011727
Takahashi, Rie ; Akizawa, Yasuhiro ; Uchida, Atsushi ; Harayama, Takahisa ; Tsuzuki, Ken ; Sunada, Satoshi ; Arai, Kenichi ; Yoshimura, Kazuyuki ; Davis, Peter. / Fast physical random bit generation with photonic integrated circuits with different external cavity lengths for chaos generation. In: Optics Express. 2014 ; Vol. 22, No. 10. pp. 11727-11740.
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