Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka; Tsuyoshi Hasegawa; Shigeyuki Hosoki; Keiji Takata

doi:10.1063/1.1141189

Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka, Tsuyoshi Hasegawa, Shigeyuki Hosoki, Keiji Takata

School of Advanced Science and Engineering

Research output: Contribution to journal › Article

11 Citations (Scopus)

Abstract

A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

Original language	English
Pages (from-to)	1342-1343
Number of pages	2
Journal	Review of Scientific Instruments
Volume	61
Issue number	4
DOIs	https://doi.org/10.1063/1.1141189
Publication status	Published - 1990 Dec 1

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ASJC Scopus subject areas

Instrumentation

Cite this

Hosaka, S., Hasegawa, T., Hosoki, S., & Takata, K. (1990). Fast scanning tunneling microscope for dynamic observation. Review of Scientific Instruments, 61(4), 1342-1343. https://doi.org/10.1063/1.1141189

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Access to Document

10.1063/1.1141189