Abstract
A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.
Original language | English |
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Pages (from-to) | 1342-1343 |
Number of pages | 2 |
Journal | Review of Scientific Instruments |
Volume | 61 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1990 |
Externally published | Yes |
ASJC Scopus subject areas
- Instrumentation