Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka; Tsuyoshi Hasegawa; Shigeyuki Hosoki; Keiji Takata

doi:10.1063/1.1141189

Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka^*, Tsuyoshi Hasegawa, Shigeyuki Hosoki, Keiji Takata

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

Original language	English
Pages (from-to)	1342-1343
Number of pages	2
Journal	Review of Scientific Instruments
Volume	61
Issue number	4
DOIs	https://doi.org/10.1063/1.1141189
Publication status	Published - 1990
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1141189

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@article{259ca18e485c4f6b99588d9b0c8b5569,

title = "Fast scanning tunneling microscope for dynamic observation",

abstract = "A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.",

author = "Sumio Hosaka and Tsuyoshi Hasegawa and Shigeyuki Hosoki and Keiji Takata",

year = "1990",

doi = "10.1063/1.1141189",

language = "English",

volume = "61",

pages = "1342--1343",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

number = "4",

}

TY - JOUR

T1 - Fast scanning tunneling microscope for dynamic observation

AU - Hosaka, Sumio

AU - Hasegawa, Tsuyoshi

AU - Hosoki, Shigeyuki

AU - Takata, Keiji

PY - 1990

Y1 - 1990

N2 - A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

AB - A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

UR - http://www.scopus.com/inward/record.url?scp=0042008383&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0042008383&partnerID=8YFLogxK

U2 - 10.1063/1.1141189

DO - 10.1063/1.1141189

M3 - Article

AN - SCOPUS:0042008383

VL - 61

SP - 1342

EP - 1343

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 4

ER -

Fast scanning tunneling microscope for dynamic observation

Abstract

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