Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka, Tsuyoshi Hasegawa, Shigeyuki Hosoki, Keiji Takata

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

Original languageEnglish
Pages (from-to)1342-1343
Number of pages2
JournalReview of Scientific Instruments
Volume61
Issue number4
DOIs
Publication statusPublished - 1990 Dec 1

    Fingerprint

ASJC Scopus subject areas

  • Instrumentation

Cite this