Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka*, Tsuyoshi Hasegawa, Shigeyuki Hosoki, Keiji Takata

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

Original languageEnglish
Pages (from-to)1342-1343
Number of pages2
JournalReview of Scientific Instruments
Issue number4
Publication statusPublished - 1990
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation


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