Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka, Tsuyoshi Hasegawa, Shigeyuki Hosoki, Keiji Takata

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

Original languageEnglish
Pages (from-to)1342-1343
Number of pages2
JournalReview of Scientific Instruments
Volume61
Issue number4
DOIs
Publication statusPublished - 1990
Externally publishedYes

Fingerprint

Tunnels
Microscopes
microscopes
Scanning
tunnels
scanning
probes
Compensation and Redress

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Instrumentation

Cite this

Fast scanning tunneling microscope for dynamic observation. / Hosaka, Sumio; Hasegawa, Tsuyoshi; Hosoki, Shigeyuki; Takata, Keiji.

In: Review of Scientific Instruments, Vol. 61, No. 4, 1990, p. 1342-1343.

Research output: Contribution to journalArticle

Hosaka, Sumio ; Hasegawa, Tsuyoshi ; Hosoki, Shigeyuki ; Takata, Keiji. / Fast scanning tunneling microscope for dynamic observation. In: Review of Scientific Instruments. 1990 ; Vol. 61, No. 4. pp. 1342-1343.
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