Fault diagnosis method using a signed digraph for multiple origins of failures - Evaluation of the diagnosis accuracy

Shigeyuki Tateno, Hisayoshi Matsuyama, Yoshifumi Tsuge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

A fault diagnosis algorithm using a signed digraph as a model of a system is useful to real-time diagnosis of failures that occur in a chemical plant. It has been improved so much that it can find multiple origins of failures that occur in the plant at the same time. It is imperative that the diagnosis system be evaluated in the design phase of the system in advance for its practical use. In this paper, an accuracy of diagnostic results using the algorithm for multiple origins has been examined by its application to data obtained by the simulation of tank pipeline systems. The accuracy of diagnosis has been evaluated properly by the size of the greatest set of candidates.

Original languageEnglish
Title of host publicationProceedings of the 2006 IEEE International Conference on Control Applications
Pages3271-3276
Number of pages6
DOIs
Publication statusPublished - 2007 Dec 1
EventJoint 2006 IEEE Conference on Control Applications (CCA), Computer-Aided Control Systems Design Symposium (CACSD) and International Symposium on Intelligent Control (ISIC) - Munich, Germany
Duration: 2006 Oct 42006 Oct 6

Publication series

NameProceedings of the IEEE International Conference on Control Applications

Conference

ConferenceJoint 2006 IEEE Conference on Control Applications (CCA), Computer-Aided Control Systems Design Symposium (CACSD) and International Symposium on Intelligent Control (ISIC)
CountryGermany
CityMunich
Period06/10/406/10/6

ASJC Scopus subject areas

  • Engineering(all)

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    Tateno, S., Matsuyama, H., & Tsuge, Y. (2007). Fault diagnosis method using a signed digraph for multiple origins of failures - Evaluation of the diagnosis accuracy. In Proceedings of the 2006 IEEE International Conference on Control Applications (pp. 3271-3276). [4067591] (Proceedings of the IEEE International Conference on Control Applications). https://doi.org/10.1109/CCA.2006.286152