Fault effect of open faults considering adjacent signal lines in a 90 nm IC

Hiroyuki Yotsuyanagi; Masaki Hashizume; Toshiyuki Tsutsumi; Koji Yamazaki; Takashi Aikyo; Yoshinobu Higami; Hiroshi Takahashi; Yuzo Takamatsu

doi:10.1109/VLSI.Design.2009.60

Fault effect of open faults considering adjacent signal lines in a 90 nm IC

Hiroyuki Yotsuyanagi^*, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Citations (Scopus)

Abstract

Open faults are difficult to test since the voltage at the floating line is unpredicted and depends on the voltage at the adjacent lines. The modeling for open faults with considering adjacent lines has been proposed in [10]. In this work, the 90 nm IC is designed and fabricated to evaluate how the voltage at adjacent lines affect the defective line. The open fault macros with a transmission gate and with an intentional break are included in the IC. The nine lines are placed in parallel in three layers to observe the effect of the coupling capacitance when an open occurs. The benchmark circuits with the open fault macro are also included in the IC. The simulation and experimental results show that the relationship between the floating line and the adjacent lines. The experimental results are also compared with the open fault model that calculate the weighted sum of voltages at the adjacent lines.

Original language	English
Title of host publication	Proceedings
Subtitle of host publication	22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems
Pages	91-96
Number of pages	6
DOIs	https://doi.org/10.1109/VLSI.Design.2009.60
Publication status	Published - 2009
Externally published	Yes
Event	22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems - New Delhi, India Duration: 2009 Jan 5 → 2009 Jan 9

Publication series

Name	Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems

Conference

Conference	22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems
Country/Territory	India
City	New Delhi
Period	09/1/5 → 09/1/9

ASJC Scopus subject areas

Hardware and Architecture
Control and Systems Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/VLSI.Design.2009.60

Cite this

Yotsuyanagi, H., Hashizume, M., Tsutsumi, T., Yamazaki, K., Aikyo, T., Higami, Y., Takahashi, H., & Takamatsu, Y. (2009). Fault effect of open faults considering adjacent signal lines in a 90 nm IC. In Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems (pp. 91-96). [4749658] (Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems). https://doi.org/10.1109/VLSI.Design.2009.60

Fault effect of open faults considering adjacent signal lines in a 90 nm IC. / Yotsuyanagi, Hiroyuki; Hashizume, Masaki; Tsutsumi, Toshiyuki et al.

Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems. 2009. p. 91-96 4749658 (Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yotsuyanagi, H, Hashizume, M, Tsutsumi, T, Yamazaki, K, Aikyo, T, Higami, Y, Takahashi, H & Takamatsu, Y 2009, Fault effect of open faults considering adjacent signal lines in a 90 nm IC. in Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems., 4749658, Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems, pp. 91-96, 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems, New Delhi, India, 09/1/5. https://doi.org/10.1109/VLSI.Design.2009.60

Yotsuyanagi H, Hashizume M, Tsutsumi T, Yamazaki K, Aikyo T, Higami Y et al. Fault effect of open faults considering adjacent signal lines in a 90 nm IC. In Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems. 2009. p. 91-96. 4749658. (Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems). doi: 10.1109/VLSI.Design.2009.60

Yotsuyanagi, Hiroyuki ; Hashizume, Masaki ; Tsutsumi, Toshiyuki et al. / Fault effect of open faults considering adjacent signal lines in a 90 nm IC. Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems. 2009. pp. 91-96 (Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems).

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AU - Aikyo, Takashi

AU - Higami, Yoshinobu

AU - Takahashi, Hiroshi

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Fault effect of open faults considering adjacent signal lines in a 90 nm IC

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