Fidelity of near-field intensity distribution of surface plasmon on slightly rough surfaces

Research output: Contribution to journalArticle

Abstract

Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.

Original languageEnglish
Pages (from-to)2065-2070
Number of pages6
JournalIEICE Transactions on Electronics
VolumeE85-C
Issue number12 SPEC.
Publication statusPublished - 2002 Dec
Externally publishedYes

Fingerprint

Electromagnetic waves
Metals
Polarization

Keywords

  • Functional
  • Near-field
  • Plasmon
  • Scattering
  • Stochastic

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Fidelity of near-field intensity distribution of surface plasmon on slightly rough surfaces. / Kawanishi, Tetsuya.

In: IEICE Transactions on Electronics, Vol. E85-C, No. 12 SPEC., 12.2002, p. 2065-2070.

Research output: Contribution to journalArticle

@article{cb4e062038a0417aaf4025af005ee11e,
title = "Fidelity of near-field intensity distribution of surface plasmon on slightly rough surfaces",
abstract = "Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.",
keywords = "Functional, Near-field, Plasmon, Scattering, Stochastic",
author = "Tetsuya Kawanishi",
year = "2002",
month = "12",
language = "English",
volume = "E85-C",
pages = "2065--2070",
journal = "IEICE Transactions on Electronics",
issn = "0916-8524",
publisher = "Maruzen Co., Ltd/Maruzen Kabushikikaisha",
number = "12 SPEC.",

}

TY - JOUR

T1 - Fidelity of near-field intensity distribution of surface plasmon on slightly rough surfaces

AU - Kawanishi, Tetsuya

PY - 2002/12

Y1 - 2002/12

N2 - Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.

AB - Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.

KW - Functional

KW - Near-field

KW - Plasmon

KW - Scattering

KW - Stochastic

UR - http://www.scopus.com/inward/record.url?scp=0037002076&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037002076&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0037002076

VL - E85-C

SP - 2065

EP - 2070

JO - IEICE Transactions on Electronics

JF - IEICE Transactions on Electronics

SN - 0916-8524

IS - 12 SPEC.

ER -