Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism

Atsushi Yajima, Wataru Kobayashi, T. Ichimura, B. Cho, C. Oshima

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationTechnical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages107-108
    Number of pages2
    Volume2003-January
    ISBN (Electronic)4818195154, 9784818195158
    DOIs
    Publication statusPublished - 2003
    Event16th International Vacuum Microelectronics Conference, IVMC 2003 - Toyonaka, Osaka, Japan
    Duration: 2003 Jul 72003 Jul 11

    Other

    Other16th International Vacuum Microelectronics Conference, IVMC 2003
    CountryJapan
    CityToyonaka, Osaka
    Period03/7/703/7/11

    Fingerprint

    Electron sources
    electron sources
    Prisms
    prisms
    interference

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Condensed Matter Physics
    • Electronic, Optical and Magnetic Materials

    Cite this

    Yajima, A., Kobayashi, W., Ichimura, T., Cho, B., & Oshima, C. (2003). Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism. In Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003 (Vol. 2003-January, pp. 107-108). [1223006] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVMC.2003.1223006

    Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism. / Yajima, Atsushi; Kobayashi, Wataru; Ichimura, T.; Cho, B.; Oshima, C.

    Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. Vol. 2003-January Institute of Electrical and Electronics Engineers Inc., 2003. p. 107-108 1223006.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Yajima, A, Kobayashi, W, Ichimura, T, Cho, B & Oshima, C 2003, Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism. in Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. vol. 2003-January, 1223006, Institute of Electrical and Electronics Engineers Inc., pp. 107-108, 16th International Vacuum Microelectronics Conference, IVMC 2003, Toyonaka, Osaka, Japan, 03/7/7. https://doi.org/10.1109/IVMC.2003.1223006
    Yajima A, Kobayashi W, Ichimura T, Cho B, Oshima C. Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism. In Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. Vol. 2003-January. Institute of Electrical and Electronics Engineers Inc. 2003. p. 107-108. 1223006 https://doi.org/10.1109/IVMC.2003.1223006
    Yajima, Atsushi ; Kobayashi, Wataru ; Ichimura, T. ; Cho, B. ; Oshima, C. / Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism. Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. Vol. 2003-January Institute of Electrical and Electronics Engineers Inc., 2003. pp. 107-108
    @inproceedings{712955d3f6bb469b8b1860736d0203e3,
    title = "Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism",
    author = "Atsushi Yajima and Wataru Kobayashi and T. Ichimura and B. Cho and C. Oshima",
    year = "2003",
    doi = "10.1109/IVMC.2003.1223006",
    language = "English",
    volume = "2003-January",
    pages = "107--108",
    booktitle = "Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003",
    publisher = "Institute of Electrical and Electronics Engineers Inc.",
    address = "United States",

    }

    TY - GEN

    T1 - Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism

    AU - Yajima, Atsushi

    AU - Kobayashi, Wataru

    AU - Ichimura, T.

    AU - Cho, B.

    AU - Oshima, C.

    PY - 2003

    Y1 - 2003

    UR - http://www.scopus.com/inward/record.url?scp=84943543889&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=84943543889&partnerID=8YFLogxK

    U2 - 10.1109/IVMC.2003.1223006

    DO - 10.1109/IVMC.2003.1223006

    M3 - Conference contribution

    AN - SCOPUS:84943543889

    VL - 2003-January

    SP - 107

    EP - 108

    BT - Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003

    PB - Institute of Electrical and Electronics Engineers Inc.

    ER -