Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism

Atsushi Yajima, Wataru Kobayashi, T. Ichimura, B. Cho, C. Oshima

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationTechnical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages107-108
    Number of pages2
    Volume2003-January
    ISBN (Electronic)4818195154, 9784818195158
    DOIs
    Publication statusPublished - 2003
    Event16th International Vacuum Microelectronics Conference, IVMC 2003 - Toyonaka, Osaka, Japan
    Duration: 2003 Jul 72003 Jul 11

    Other

    Other16th International Vacuum Microelectronics Conference, IVMC 2003
    CountryJapan
    CityToyonaka, Osaka
    Period03/7/703/7/11

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Condensed Matter Physics
    • Electronic, Optical and Magnetic Materials

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