First-principles study on intrinsic point defects in rhombohedral LaAlO 3 and their effects on electrical properties

Xiaojun Xie, Yonghong Cheng, Bing Xiao, Yoshimichi Ohki

    Research output: Contribution to journalArticle

    4 Citations (Scopus)

    Abstract

    Formation energies and energy levels of various neutral and charged defects in bulk rhombohedral LaAlO 3 are calculated numerically in different equilibrium conditions under different oxygen partial pressures, using first-principles plane-wave calculations. The roles of such defects in electrical properties of LaAlO 3 are also discussed. The results obtained by calculations show that the formation energy becomes low for oxygen interstitial if LaAlO 3 is in an oxygen-rich condition. In contrast, an oxygen vacancy is easily formed in a condition where oxygen is deficient and metal elements are relatively rich, even if the oxygen partial pressure is high. These results explain well the concentration change of constituent elements in LaAlO 3 under different treatment atmospheres. Furthermore, the calculations can interpret a large tunnelling current that is often observed in a metal-oxide-silicon structure using LaAlO 3 as the oxide layer, since the O vacancy has an energy level near the valence band maximum of Si.

    Original languageEnglish
    Article number041103
    JournalJapanese Journal of Applied Physics
    Volume51
    Issue number4 PART 1
    DOIs
    Publication statusPublished - 2012 Apr

    Fingerprint

    Point defects
    point defects
    Electric properties
    electrical properties
    Oxygen
    oxygen
    Partial pressure
    Electron energy levels
    energy of formation
    partial pressure
    energy levels
    Defects
    Silicon oxides
    Oxygen vacancies
    Valence bands
    Metals
    Chemical elements
    defects
    Vacancies
    metal oxides

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)

    Cite this

    First-principles study on intrinsic point defects in rhombohedral LaAlO 3 and their effects on electrical properties. / Xie, Xiaojun; Cheng, Yonghong; Xiao, Bing; Ohki, Yoshimichi.

    In: Japanese Journal of Applied Physics, Vol. 51, No. 4 PART 1, 041103, 04.2012.

    Research output: Contribution to journalArticle

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