First undersea-qualified 980 nm pump laser diode module evaluated with massive life test

M. Usami, N. Edagawa, Yuichi Matsushima, H. Horie, T. Fujimori, I. Sakamoto, H. Gotoh

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)

Abstract

Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.

Original languageEnglish
Title of host publicationConference on Optical Fiber Communication, Technical Digest Series
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Publication statusPublished - 1999
Externally publishedYes

ASJC Scopus subject areas

  • Computer Science(all)
  • Engineering(all)

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