First undersea-qualified 980 nm pump laser diode module evaluated with massive life test

M. Usami, N. Edagawa, Yuichi Matsushima, H. Horie, T. Fujimori, I. Sakamoto, H. Gotoh

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)

Abstract

Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.

Original languageEnglish
Title of host publicationConference on Optical Fiber Communication, Technical Digest Series
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Publication statusPublished - 1999
Externally publishedYes

Fingerprint

Submarine cables
Failure modes
Semiconductor lasers
Aging of materials
Wear of materials
Pumps

ASJC Scopus subject areas

  • Computer Science(all)
  • Engineering(all)

Cite this

Usami, M., Edagawa, N., Matsushima, Y., Horie, H., Fujimori, T., Sakamoto, I., & Gotoh, H. (1999). First undersea-qualified 980 nm pump laser diode module evaluated with massive life test. In Conference on Optical Fiber Communication, Technical Digest Series Piscataway, NJ, United States: IEEE.

First undersea-qualified 980 nm pump laser diode module evaluated with massive life test. / Usami, M.; Edagawa, N.; Matsushima, Yuichi; Horie, H.; Fujimori, T.; Sakamoto, I.; Gotoh, H.

Conference on Optical Fiber Communication, Technical Digest Series. Piscataway, NJ, United States : IEEE, 1999.

Research output: Chapter in Book/Report/Conference proceedingChapter

Usami, M, Edagawa, N, Matsushima, Y, Horie, H, Fujimori, T, Sakamoto, I & Gotoh, H 1999, First undersea-qualified 980 nm pump laser diode module evaluated with massive life test. in Conference on Optical Fiber Communication, Technical Digest Series. IEEE, Piscataway, NJ, United States.
Usami M, Edagawa N, Matsushima Y, Horie H, Fujimori T, Sakamoto I et al. First undersea-qualified 980 nm pump laser diode module evaluated with massive life test. In Conference on Optical Fiber Communication, Technical Digest Series. Piscataway, NJ, United States: IEEE. 1999
Usami, M. ; Edagawa, N. ; Matsushima, Yuichi ; Horie, H. ; Fujimori, T. ; Sakamoto, I. ; Gotoh, H. / First undersea-qualified 980 nm pump laser diode module evaluated with massive life test. Conference on Optical Fiber Communication, Technical Digest Series. Piscataway, NJ, United States : IEEE, 1999.
@inbook{e324513439434e39950bf64ba36d5ae2,
title = "First undersea-qualified 980 nm pump laser diode module evaluated with massive life test",
abstract = "Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01{\%}. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.",
author = "M. Usami and N. Edagawa and Yuichi Matsushima and H. Horie and T. Fujimori and I. Sakamoto and H. Gotoh",
year = "1999",
language = "English",
booktitle = "Conference on Optical Fiber Communication, Technical Digest Series",
publisher = "IEEE",

}

TY - CHAP

T1 - First undersea-qualified 980 nm pump laser diode module evaluated with massive life test

AU - Usami, M.

AU - Edagawa, N.

AU - Matsushima, Yuichi

AU - Horie, H.

AU - Fujimori, T.

AU - Sakamoto, I.

AU - Gotoh, H.

PY - 1999

Y1 - 1999

N2 - Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.

AB - Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.

UR - http://www.scopus.com/inward/record.url?scp=0032668881&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032668881&partnerID=8YFLogxK

M3 - Chapter

AN - SCOPUS:0032668881

BT - Conference on Optical Fiber Communication, Technical Digest Series

PB - IEEE

CY - Piscataway, NJ, United States

ER -