Fluctuations of electron beams emitted from single-atom electron sources prepared with different techniques

Tsuyoshi Ishikawa, Keisuke Tagawa, Tomohiro Urata, Chuhei Oshima, Boklae Cho, Eiji Rokuta

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We compared fluctuations of electron beams emitted from single-atom electron sources, on which the surface Pd metals were deposited by two different techniques, vacuum deposition and electroplating deposition. The similar nano-pyramids were fabricated successfully by both the techniques, but the stabilities of the beam currents were different each other; the electron source prepared by vacuum deposition was far superior to those of electroplating deposition. The possible origin was discussed on the basis of AES analysis.

Original languageEnglish
Pages (from-to)11-14
Number of pages4
Journale-Journal of Surface Science and Nanotechnology
Volume6
DOIs
Publication statusPublished - 2008 Jan 18

Fingerprint

Electron sources
Vacuum deposition
vacuum deposition
electron sources
electroplating
Electroplating
Electron beams
electron beams
Electrons
Vacuum
Atoms
pyramids
beam currents
metal surfaces
atoms
Metals

Keywords

  • Electron emission
  • Extreme High Vacuum (XHV)
  • Field emission microscopy
  • Scanning Electron Microscopy (SEM)
  • Single-atom electron source

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Materials Science (miscellaneous)

Cite this

Fluctuations of electron beams emitted from single-atom electron sources prepared with different techniques. / Ishikawa, Tsuyoshi; Tagawa, Keisuke; Urata, Tomohiro; Oshima, Chuhei; Cho, Boklae; Rokuta, Eiji.

In: e-Journal of Surface Science and Nanotechnology, Vol. 6, 18.01.2008, p. 11-14.

Research output: Contribution to journalArticle

Ishikawa, Tsuyoshi ; Tagawa, Keisuke ; Urata, Tomohiro ; Oshima, Chuhei ; Cho, Boklae ; Rokuta, Eiji. / Fluctuations of electron beams emitted from single-atom electron sources prepared with different techniques. In: e-Journal of Surface Science and Nanotechnology. 2008 ; Vol. 6. pp. 11-14.
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