Fluctuations of field emission currents under extreme high vacuum

B. Cho; T. Ishikawa; C. Oshima

doi:10.1380/ejssnt.2008.64

Fluctuations of field emission currents under extreme high vacuum

B. Cho^*, T. Ishikawa, C. Oshima

^*Corresponding author for this work

Waseda University

Research output: Contribution to journal › Article › peer-review

Abstract

We report the result of the noise measurement using an extreme high vacuum field emission microscope (XHV-FEM) operating under ̃ 7 × 10 ^-10 Pa. The fluctuation of a field emission (FE) current for a clean W(111) tip was comparable to the corresponding shot noise fluctuation, demonstrating the suitability of the XHV-FEM for investigation on the inherent fluctuation behavior of the FE process. Semilogarithmic damping curves of FE currents were linear for more than 10 hours. The noise of field emission (FE) currents ranging from 10 pA to 100 μA was measured under ̃ 7 × 10^-10 Pa. The lowest frequency measurement of shot noise was recorded at below 10 Hz.

Original language	English
Pages (from-to)	64-67
Number of pages	4
Journal	e-Journal of Surface Science and Nanotechnology
Volume	6
DOIs	https://doi.org/10.1380/ejssnt.2008.64
Publication status	Published - 2008 Feb 19

Keywords

Field emission
Field emission Microscopy
Fluctuation

ASJC Scopus subject areas

Surfaces, Coatings and Films
Materials Science (miscellaneous)

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10.1380/ejssnt.2008.64

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@article{cb48a093e7df4049a6c0bc191b220de3,

title = "Fluctuations of field emission currents under extreme high vacuum",

abstract = "We report the result of the noise measurement using an extreme high vacuum field emission microscope (XHV-FEM) operating under{\~ } 7 × 10 -10 Pa. The fluctuation of a field emission (FE) current for a clean W(111) tip was comparable to the corresponding shot noise fluctuation, demonstrating the suitability of the XHV-FEM for investigation on the inherent fluctuation behavior of the FE process. Semilogarithmic damping curves of FE currents were linear for more than 10 hours. The noise of field emission (FE) currents ranging from 10 pA to 100 μA was measured under{\~ } 7 × 10-10 Pa. The lowest frequency measurement of shot noise was recorded at below 10 Hz.",

keywords = "Field emission, Field emission Microscopy, Fluctuation",

author = "B. Cho and T. Ishikawa and C. Oshima",

year = "2008",

month = feb,

day = "19",

doi = "10.1380/ejssnt.2008.64",

language = "English",

volume = "6",

pages = "64--67",

journal = "e-Journal of Surface Science and Nanotechnology",

issn = "1348-0391",

publisher = "Surface Science Society of Japan",

}

TY - JOUR

T1 - Fluctuations of field emission currents under extreme high vacuum

AU - Cho, B.

AU - Ishikawa, T.

AU - Oshima, C.

PY - 2008/2/19

Y1 - 2008/2/19

N2 - We report the result of the noise measurement using an extreme high vacuum field emission microscope (XHV-FEM) operating under ̃ 7 × 10 -10 Pa. The fluctuation of a field emission (FE) current for a clean W(111) tip was comparable to the corresponding shot noise fluctuation, demonstrating the suitability of the XHV-FEM for investigation on the inherent fluctuation behavior of the FE process. Semilogarithmic damping curves of FE currents were linear for more than 10 hours. The noise of field emission (FE) currents ranging from 10 pA to 100 μA was measured under ̃ 7 × 10-10 Pa. The lowest frequency measurement of shot noise was recorded at below 10 Hz.

AB - We report the result of the noise measurement using an extreme high vacuum field emission microscope (XHV-FEM) operating under ̃ 7 × 10 -10 Pa. The fluctuation of a field emission (FE) current for a clean W(111) tip was comparable to the corresponding shot noise fluctuation, demonstrating the suitability of the XHV-FEM for investigation on the inherent fluctuation behavior of the FE process. Semilogarithmic damping curves of FE currents were linear for more than 10 hours. The noise of field emission (FE) currents ranging from 10 pA to 100 μA was measured under ̃ 7 × 10-10 Pa. The lowest frequency measurement of shot noise was recorded at below 10 Hz.

KW - Field emission

KW - Field emission Microscopy

KW - Fluctuation

UR - http://www.scopus.com/inward/record.url?scp=40049097236&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=40049097236&partnerID=8YFLogxK

U2 - 10.1380/ejssnt.2008.64

DO - 10.1380/ejssnt.2008.64

M3 - Article

AN - SCOPUS:40049097236

SN - 1348-0391

VL - 6

SP - 64

EP - 67

JO - e-Journal of Surface Science and Nanotechnology

JF - e-Journal of Surface Science and Nanotechnology

ER -

Fluctuations of field emission currents under extreme high vacuum

Abstract

Keywords

ASJC Scopus subject areas

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