Fluctuations of field emission currents under extreme high vacuum

B. Cho, T. Ishikawa, C. Oshima

Research output: Contribution to journalArticle

Abstract

We report the result of the noise measurement using an extreme high vacuum field emission microscope (XHV-FEM) operating under ̃ 7 × 10 -10 Pa. The fluctuation of a field emission (FE) current for a clean W(111) tip was comparable to the corresponding shot noise fluctuation, demonstrating the suitability of the XHV-FEM for investigation on the inherent fluctuation behavior of the FE process. Semilogarithmic damping curves of FE currents were linear for more than 10 hours. The noise of field emission (FE) currents ranging from 10 pA to 100 μA was measured under ̃ 7 × 10-10 Pa. The lowest frequency measurement of shot noise was recorded at below 10 Hz.

Original languageEnglish
Pages (from-to)64-67
Number of pages4
Journale-Journal of Surface Science and Nanotechnology
Volume6
DOIs
Publication statusPublished - 2008 Feb 19

Fingerprint

Vacuum
high vacuum
Field emission
Noise
field emission
Shot noise
shot noise
Field emission microscopes
Finite element method
frequency measurement
noise measurement
Damping
damping
microscopes
low frequencies
curves

Keywords

  • Field emission
  • Field emission Microscopy
  • Fluctuation

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Materials Science (miscellaneous)

Cite this

Fluctuations of field emission currents under extreme high vacuum. / Cho, B.; Ishikawa, T.; Oshima, C.

In: e-Journal of Surface Science and Nanotechnology, Vol. 6, 19.02.2008, p. 64-67.

Research output: Contribution to journalArticle

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