Fully secure lattice-based group signatures with verifier-local revocation

M. Nisansala, S. Perera, Takeshi Koshiba

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In PKC 2014, Langlois et al. proposed the first lattice-based group signature scheme with the verifier-local revocability. The security of their scheme is selfless anonymity, which is weaker than the security model defined by Bellare, Micciancio and Warinschi (EUROCRYPT 2003). By using the technique in the group signature scheme proposed by Ling et al. (PKC 2015), we propose a group signature scheme with the verifier-local revocability. For the security discussion of our scheme, we adapt the BMW03 model to cope with revocation queries, since the BMW03 model is for static groups. Then, we show that our scheme achieves the full anonymity in the adapted BMW03 model.

Original languageEnglish
Title of host publicationProceedings - 31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages795-802
Number of pages8
ISBN (Electronic)9781509060283
DOIs
Publication statusPublished - 2017 May 5
Externally publishedYes
Event31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017 - Taipei, Taiwan, Province of China
Duration: 2017 Mar 272017 Mar 29

Other

Other31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017
CountryTaiwan, Province of China
CityTaipei
Period17/3/2717/3/29

Keywords

  • Full anonymity
  • Full traceability
  • Group signatures
  • Lattice-based
  • Revocation

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Nisansala, M., Perera, S., & Koshiba, T. (2017). Fully secure lattice-based group signatures with verifier-local revocation. In Proceedings - 31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017 (pp. 795-802). [7920989] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/AINA.2017.65