GECOM

Test data compression combined with all unknown response masking

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)

    Abstract

    This paper introduces GECOM technology, a novel test compression method with seamless integration of test GEneration, test COmpression (i.e. integrated compression on scan stimulus and masking bits) and all unknown scan responses Masking for manufacturing test cost reduction. Unlike most of prior methods, the proposed method considers the unknown responses during ATPG procedure and selectively encodes the specified 1 or 0 bits (either 1s or 0s) in scan slices for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed GECOM technology consists of GECOM architecture and GECOM ATPG technique. In the GECOM architecture, for a circuit with N internal scan chains, only c tester channels, where c = [log2 N] +2, are required. GECOM ATPG generates test patterns for the GECOM architecture thus not only the scan inputs could be efficiently compressed but also all the unknown responses would be masked. Experimental results on both benchmark circuits and real industrial designs indicated the effectiveness of the proposed GECOM technique.

    Original languageEnglish
    Title of host publicationProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
    Pages577-582
    Number of pages6
    DOIs
    Publication statusPublished - 2008
    Event2008 Asia and South Pacific Design Automation Conference, ASP-DAC - Seoul
    Duration: 2008 Mar 212008 Mar 24

    Other

    Other2008 Asia and South Pacific Design Automation Conference, ASP-DAC
    CitySeoul
    Period08/3/2108/3/24

    Fingerprint

    Data compression
    Networks (circuits)
    Cost reduction
    Product design
    Masks

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2008). GECOM: Test data compression combined with all unknown response masking. In Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC (pp. 577-582). [4484018] https://doi.org/10.1109/ASPDAC.2008.4484018

    GECOM : Test data compression combined with all unknown response masking. / Shi, Youhua; Togawa, Nozomu; Yanagisawa, Masao; Ohtsuki, Tatsuo.

    Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC. 2008. p. 577-582 4484018.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Shi, Y, Togawa, N, Yanagisawa, M & Ohtsuki, T 2008, GECOM: Test data compression combined with all unknown response masking. in Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC., 4484018, pp. 577-582, 2008 Asia and South Pacific Design Automation Conference, ASP-DAC, Seoul, 08/3/21. https://doi.org/10.1109/ASPDAC.2008.4484018
    Shi Y, Togawa N, Yanagisawa M, Ohtsuki T. GECOM: Test data compression combined with all unknown response masking. In Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC. 2008. p. 577-582. 4484018 https://doi.org/10.1109/ASPDAC.2008.4484018
    Shi, Youhua ; Togawa, Nozomu ; Yanagisawa, Masao ; Ohtsuki, Tatsuo. / GECOM : Test data compression combined with all unknown response masking. Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC. 2008. pp. 577-582
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