GECOM: Test data compression combined with all unknown response masking

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

This paper introduces GECOM technology, a novel test compression method with seamless integration of test GEneration, test COmpression (i.e. integrated compression on scan stimulus and masking bits) and all unknown scan responses Masking for manufacturing test cost reduction. Unlike most of prior methods, the proposed method considers the unknown responses during ATPG procedure and selectively encodes the specified 1 or 0 bits (either 1s or 0s) in scan slices for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed GECOM technology consists of GECOM architecture and GECOM ATPG technique. In the GECOM architecture, for a circuit with N internal scan chains, only c tester channels, where c = [log2 N] +2, are required. GECOM ATPG generates test patterns for the GECOM architecture thus not only the scan inputs could be efficiently compressed but also all the unknown responses would be masked. Experimental results on both benchmark circuits and real industrial designs indicated the effectiveness of the proposed GECOM technique.

Original languageEnglish
Title of host publication2008 Asia and South Pacific Design Automation Conference, ASP-DAC
Pages577-582
Number of pages6
DOIs
Publication statusPublished - 2008 Aug 21
Event2008 Asia and South Pacific Design Automation Conference, ASP-DAC - Seoul, Korea, Republic of
Duration: 2008 Mar 212008 Mar 24

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference2008 Asia and South Pacific Design Automation Conference, ASP-DAC
CountryKorea, Republic of
CitySeoul
Period08/3/2108/3/24

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ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Cite this

Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2008). GECOM: Test data compression combined with all unknown response masking. In 2008 Asia and South Pacific Design Automation Conference, ASP-DAC (pp. 577-582). [4484018] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2008.4484018