Abstract
An atomic force microscopy (AFM) probe tip characterizer with 14 line and space structures and two knife edges was fabricated by means of a superlattice technique. The shape of a probe tip both before and after AFM imaging was acquired by this tip characterizer with general variations <1.5nm; depending on imaging conditions. The geometric structures of carbon nanotubes (CNTs) on a SiO2 substrate were studied by dynamic mode AFM in conjunction with this tip characterizer. Contact points between the tip and the CNTs were detected by observing changes in the AFM phase images. A modified CNT width correction model was established to calculate the estimated and upper-limit widths of two CNTs. The experimental results showed that imaging under a weak attractive force was suitable for obtaining accurate CNT height measurements, whereas a weak repulsive force provided the most accurate widths. Differing heights and widths between the two CNTs suggested that one CNT was double-walled, whereas the other had more than two walls; these results agree with transmission electron microscopy (TEM) measurements of the CNTs.
| Original language | English |
|---|---|
| Pages (from-to) | 6128-6133 |
| Number of pages | 6 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 47 |
| Issue number | 7 PART 3 |
| DOIs | |
| Publication status | Published - 2008 Jul 18 |
| Externally published | Yes |
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Keywords
- AFM
- CNT
- Contact point
- Tip characterizer
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
Cite this
Geometric characterization of carbon nanotubes by atomic force microscopy in conjunction with a tip characterizer. / Wang, Chunmei; Itoh, Hiroshi; Homma, Yoshikazu; Sun, Jielin; Hu, Jun; Ichimura, Shingo.
In: Japanese Journal of Applied Physics, Vol. 47, No. 7 PART 3, 18.07.2008, p. 6128-6133.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Geometric characterization of carbon nanotubes by atomic force microscopy in conjunction with a tip characterizer
AU - Wang, Chunmei
AU - Itoh, Hiroshi
AU - Homma, Yoshikazu
AU - Sun, Jielin
AU - Hu, Jun
AU - Ichimura, Shingo
PY - 2008/7/18
Y1 - 2008/7/18
N2 - An atomic force microscopy (AFM) probe tip characterizer with 14 line and space structures and two knife edges was fabricated by means of a superlattice technique. The shape of a probe tip both before and after AFM imaging was acquired by this tip characterizer with general variations <1.5nm; depending on imaging conditions. The geometric structures of carbon nanotubes (CNTs) on a SiO2 substrate were studied by dynamic mode AFM in conjunction with this tip characterizer. Contact points between the tip and the CNTs were detected by observing changes in the AFM phase images. A modified CNT width correction model was established to calculate the estimated and upper-limit widths of two CNTs. The experimental results showed that imaging under a weak attractive force was suitable for obtaining accurate CNT height measurements, whereas a weak repulsive force provided the most accurate widths. Differing heights and widths between the two CNTs suggested that one CNT was double-walled, whereas the other had more than two walls; these results agree with transmission electron microscopy (TEM) measurements of the CNTs.
AB - An atomic force microscopy (AFM) probe tip characterizer with 14 line and space structures and two knife edges was fabricated by means of a superlattice technique. The shape of a probe tip both before and after AFM imaging was acquired by this tip characterizer with general variations <1.5nm; depending on imaging conditions. The geometric structures of carbon nanotubes (CNTs) on a SiO2 substrate were studied by dynamic mode AFM in conjunction with this tip characterizer. Contact points between the tip and the CNTs were detected by observing changes in the AFM phase images. A modified CNT width correction model was established to calculate the estimated and upper-limit widths of two CNTs. The experimental results showed that imaging under a weak attractive force was suitable for obtaining accurate CNT height measurements, whereas a weak repulsive force provided the most accurate widths. Differing heights and widths between the two CNTs suggested that one CNT was double-walled, whereas the other had more than two walls; these results agree with transmission electron microscopy (TEM) measurements of the CNTs.
KW - AFM
KW - CNT
KW - Contact point
KW - Tip characterizer
UR - http://www.scopus.com/inward/record.url?scp=55149109024&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=55149109024&partnerID=8YFLogxK
U2 - 10.1143/JJAP.47.6128
DO - 10.1143/JJAP.47.6128
M3 - Article
AN - SCOPUS:55149109024
VL - 47
SP - 6128
EP - 6133
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 7 PART 3
ER -