Abstract
We report Hall effect of charge carriers accumulated in organic field-effect transistors. Rubrene (C42H28) single crystals are shaped for the Hall-bar configuration so that the Hall signal is appropriately detected in external magnetic fields. It turned out that inverse Hall coefficient, having a positive sign, is close to the amount of electric-field induced charge upon the hole accumulation. The observation of the normal Hall effect means that the electromagnetic character of the surface charge is not of hopping carriers but resembles that of a two-dimensional hole-gas system. Moreover, the direct access to the density of mobile charge carriers provides a tool to understand nontrivial features of organic field-effect transistors such as gate electric field dependent mobility.
Original language | English |
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Title of host publication | Materials Research Society Symposium Proceedings |
Pages | 95-100 |
Number of pages | 6 |
Volume | 937 |
Publication status | Published - 2006 |
Externally published | Yes |
Event | 2006 MRS Spring Meeting - San Francisco, CA Duration: 2006 Apr 17 → 2006 Apr 21 |
Other
Other | 2006 MRS Spring Meeting |
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City | San Francisco, CA |
Period | 06/4/17 → 06/4/21 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials