Hard X-ray response of CdZnTe detectors in the swift burst alert telescope

Masaya Suzuki, Makoto Tashiro, Goro Sato, Shin Watanabe, Tadayuki Takahashi, Yuu Okada, Hiromitsu Takahashi, Ann Parsons, Scott Barthelmy, Jay Cummings, Neil Gehrels, Derek Hullinger, Hans Krimm, Jack Tueller

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1 Citation (Scopus)

Abstract

The Burst Alert Telescope (BAT) onboard the Swift Gamma-ray Burst Explorer (scheduled for launch in May of 2004) has a coded aperture mask and a detector array of 32,768 Cd 0.9Zn 0.1Te 1.0 (4×4mm 2 large, 2mm thick) semiconductor devices. Due to small mobility and short lifetime of carriers, the electron-hole pairs generated by irradiation of gamma-rays cannot be completely collected. Since the shape of the measured spectra has the broad low-energy tail, it is very useful for us to estimate the obtained spectra to fit the model which considers the charge transport properties depended on the depth of the photon interaction (G.Sato, 2002). The energy calibration of the BAT array and coded mask experiments were carried out at NASA/Goddard Space Flight Center between December 2002 and March 2003. We applied the model fitting to the calibration spectra, to yield the mobility-lifetime products for each detector and these values differ by over 2 orders of magnitude among detectors. Also using the mobility-lifetime parameters, we can identified the detector energy response as a fucntion of the temperature and illumination angle. But we figure out a difference between the model and the obtained data. To determine the difference between the model and the measured data, we conducted the detailed check experiment for a single CdZnTe, to show that the cause of the excess is due to the areal nonuniformity of the mobility-lifetime parameter.

Original languageEnglish
Article numberR14-2
Pages (from-to)3550-3554
Number of pages5
JournalUnknown Journal
Volume5
Publication statusPublished - 2003

Keywords

  • BAT
  • CdZnTe
  • Energy calibration
  • Gamma-ray detector
  • Mobility-lifetime products
  • Spectral modeling
  • Swift

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

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  • Cite this

    Suzuki, M., Tashiro, M., Sato, G., Watanabe, S., Takahashi, T., Okada, Y., Takahashi, H., Parsons, A., Barthelmy, S., Cummings, J., Gehrels, N., Hullinger, D., Krimm, H., & Tueller, J. (2003). Hard X-ray response of CdZnTe detectors in the swift burst alert telescope. Unknown Journal, 5, 3550-3554. [R14-2].