High-dimensional and large-scale phenotyping of yeast mutants

Yoshikazu Ohya, Jim Sese, Masashi Yukawa, Fumi Sano, Yoichiro Nakatani, Taro L. Saito, Ayaka Saka, Tomoyuki Fukuda, Satoru Ishihara, Satomi Oka, Genjiro Suzuki, Machika Watanabe, Aiko Hirata, Miwaka Ohtani, Hiroshi Sawai, Nicolas Fraysse, Jean Paul Latgé, Jean M. François, Markus Aebi, Seiji Tanaka & 5 others Sachiko Muramatsu, Hiroyuki Araki, Kintake Sonoike, Satoru Nogami, Shinichi Morishita

Research output: Contribution to journalArticle

158 Citations (Scopus)

Abstract

One of the most powerful techniques for attributing functions to genes in uni- and multicellular organisms is comprehensive analysis of mutant traits. In this study, systematic and quantitative analyses of mutant traits are achieved in the budding yeast Saccharomyces cerevisiae by investigating morphological phenotypes. Analysis of fluorescent microscopic images of triple-stained cells makes it possible to treat morphological variations as quantitative traits. Deletion of nearly half of the yeast genes not essential for growth affects these morphological traits. Similar morphological phenotypes are caused by deletions of functionally related genes, enabling a functional assignment of a locus to a specific cellular pathway. The high-dimensional phenotypic analysis of defined yeast mutant strains provides another step toward attributing gene function to all of the genes in the yeast genome.

Original languageEnglish
Pages (from-to)19015-19020
Number of pages6
JournalProceedings of the National Academy of Sciences of the United States of America
Volume102
Issue number52
DOIs
Publication statusPublished - 2005 Dec 27
Externally publishedYes

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Yeasts
Genes
Phenotype
Saccharomycetales
Essential Genes
Saccharomyces cerevisiae
Genome
Growth

Keywords

  • Cell morphology
  • Functional genomics
  • High-dimensional phenotyping
  • Phenome

ASJC Scopus subject areas

  • Genetics
  • General

Cite this

Ohya, Y., Sese, J., Yukawa, M., Sano, F., Nakatani, Y., Saito, T. L., ... Morishita, S. (2005). High-dimensional and large-scale phenotyping of yeast mutants. Proceedings of the National Academy of Sciences of the United States of America, 102(52), 19015-19020. https://doi.org/10.1073/pnas.0509436102

High-dimensional and large-scale phenotyping of yeast mutants. / Ohya, Yoshikazu; Sese, Jim; Yukawa, Masashi; Sano, Fumi; Nakatani, Yoichiro; Saito, Taro L.; Saka, Ayaka; Fukuda, Tomoyuki; Ishihara, Satoru; Oka, Satomi; Suzuki, Genjiro; Watanabe, Machika; Hirata, Aiko; Ohtani, Miwaka; Sawai, Hiroshi; Fraysse, Nicolas; Latgé, Jean Paul; François, Jean M.; Aebi, Markus; Tanaka, Seiji; Muramatsu, Sachiko; Araki, Hiroyuki; Sonoike, Kintake; Nogami, Satoru; Morishita, Shinichi.

In: Proceedings of the National Academy of Sciences of the United States of America, Vol. 102, No. 52, 27.12.2005, p. 19015-19020.

Research output: Contribution to journalArticle

Ohya, Y, Sese, J, Yukawa, M, Sano, F, Nakatani, Y, Saito, TL, Saka, A, Fukuda, T, Ishihara, S, Oka, S, Suzuki, G, Watanabe, M, Hirata, A, Ohtani, M, Sawai, H, Fraysse, N, Latgé, JP, François, JM, Aebi, M, Tanaka, S, Muramatsu, S, Araki, H, Sonoike, K, Nogami, S & Morishita, S 2005, 'High-dimensional and large-scale phenotyping of yeast mutants', Proceedings of the National Academy of Sciences of the United States of America, vol. 102, no. 52, pp. 19015-19020. https://doi.org/10.1073/pnas.0509436102
Ohya, Yoshikazu ; Sese, Jim ; Yukawa, Masashi ; Sano, Fumi ; Nakatani, Yoichiro ; Saito, Taro L. ; Saka, Ayaka ; Fukuda, Tomoyuki ; Ishihara, Satoru ; Oka, Satomi ; Suzuki, Genjiro ; Watanabe, Machika ; Hirata, Aiko ; Ohtani, Miwaka ; Sawai, Hiroshi ; Fraysse, Nicolas ; Latgé, Jean Paul ; François, Jean M. ; Aebi, Markus ; Tanaka, Seiji ; Muramatsu, Sachiko ; Araki, Hiroyuki ; Sonoike, Kintake ; Nogami, Satoru ; Morishita, Shinichi. / High-dimensional and large-scale phenotyping of yeast mutants. In: Proceedings of the National Academy of Sciences of the United States of America. 2005 ; Vol. 102, No. 52. pp. 19015-19020.
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