HIGH ENERGY ELECTRON TRANSPORT IN PARAFFIN.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    It is known that high energy electrons play an important role in triggering the damage process in the dielectrics. Energetic electrons are emitted from stress concentration sites and injected into the solid polymeric insulators, where they can break chemical bonds and create free radicals or initiate electron avalanches. In order to investigate the transport properties of the hot electrons, paraffin is used as model material, and the interfacial photoemission technique to inject electrons into it. The photoelectrons leaving the metal substrate and passing through the material are energy analyzed by the retarding potential method. The shape and the magnitude of the energy distribution curves at different sample thicknesses and irradiation energies give information about the energy loss process.

    Original languageEnglish
    Title of host publicationProceedings of the Symposium on Electrical Insulating Materials
    Place of PublicationJpn
    PublisherInst of Electrical Engineers of Japan
    Pages65-68
    Number of pages4
    Publication statusPublished - 1986

    Fingerprint

    Paraffins
    Electrons
    Electron transport properties
    Hot electrons
    Chemical bonds
    Photoemission
    Photoelectrons
    Free radicals
    Stress concentration
    Energy dissipation
    Irradiation
    Electron Transport
    Substrates
    Metals

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Racz, I., & Ohki, Y. (1986). HIGH ENERGY ELECTRON TRANSPORT IN PARAFFIN. In Proceedings of the Symposium on Electrical Insulating Materials (pp. 65-68). Jpn: Inst of Electrical Engineers of Japan.

    HIGH ENERGY ELECTRON TRANSPORT IN PARAFFIN. / Racz, I.; Ohki, Yoshimichi.

    Proceedings of the Symposium on Electrical Insulating Materials. Jpn : Inst of Electrical Engineers of Japan, 1986. p. 65-68.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Racz, I & Ohki, Y 1986, HIGH ENERGY ELECTRON TRANSPORT IN PARAFFIN. in Proceedings of the Symposium on Electrical Insulating Materials. Inst of Electrical Engineers of Japan, Jpn, pp. 65-68.
    Racz I, Ohki Y. HIGH ENERGY ELECTRON TRANSPORT IN PARAFFIN. In Proceedings of the Symposium on Electrical Insulating Materials. Jpn: Inst of Electrical Engineers of Japan. 1986. p. 65-68
    Racz, I. ; Ohki, Yoshimichi. / HIGH ENERGY ELECTRON TRANSPORT IN PARAFFIN. Proceedings of the Symposium on Electrical Insulating Materials. Jpn : Inst of Electrical Engineers of Japan, 1986. pp. 65-68
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    AB - It is known that high energy electrons play an important role in triggering the damage process in the dielectrics. Energetic electrons are emitted from stress concentration sites and injected into the solid polymeric insulators, where they can break chemical bonds and create free radicals or initiate electron avalanches. In order to investigate the transport properties of the hot electrons, paraffin is used as model material, and the interfacial photoemission technique to inject electrons into it. The photoelectrons leaving the metal substrate and passing through the material are energy analyzed by the retarding potential method. The shape and the magnitude of the energy distribution curves at different sample thicknesses and irradiation energies give information about the energy loss process.

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