High peak power pulse laser for laser induced breakdown

Toshisugu Ueda, Muneaki Wakamatsu, Nobuhiro Tomosada, Hisanori Hayashi, Tadashi Sugiyama, Takashi Yagi, Goichi Ohmae

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Using light (photons) as a means to measure various kinds of physical quantities in their normal environment has the advantage of real-time and precise measurement without interference from other objects. In the semiconductor process, for example, the measurement limit of particle size is down to O.1 μm and the measurement of elements that the particles are composed of is impossible. Presently, there is only one measuring instrument that can measure the elements and diameter of particles at the same time by putting particles in microwave induced He plasma. However, the minimum size with which particles of hydrocarbon material can be measured is limited to several μm by this method. This method can not be applied to the measurement of sub-micron particles, which is important to the semiconductor process and for functional particles. The Final goal of the research is to develop devices and systematization technology needed for the newly proposed particle measurement technology using laser induced breakdown (LIB). In particle Measurement using LIB, indispensable high peak power pulse laser (HPPL) for breakdown generation, ultraviolet fiber for passing fluorescence light and a high speed photo detection device having sub-micro second time resolution are needed. Furthermore, it is necessary to develop systematization technology and obtain final system evaluation when using these device technologies. In this paper, we mainly report on the experimental results of High Peak Power Laser (HPPL) for LIB and it's basic consideration in the fiscal year 1999.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages344-350
Number of pages7
Volume3889
Publication statusPublished - 2000
Externally publishedYes
EventAdvanced High-Power Lasers - Osaka, Jpn
Duration: 1999 Nov 11999 Nov 5

Other

OtherAdvanced High-Power Lasers
CityOsaka, Jpn
Period99/11/199/11/5

Fingerprint

Laser pulses
breakdown
Lasers
pulses
lasers
Semiconductor materials
Photons
Fluorescence
Hydrocarbons
Particle size
Microwaves
Plasmas
Fibers
hydrocarbons
time measurement
high speed
interference
microwaves
fluorescence
fibers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Ueda, T., Wakamatsu, M., Tomosada, N., Hayashi, H., Sugiyama, T., Yagi, T., & Ohmae, G. (2000). High peak power pulse laser for laser induced breakdown. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3889, pp. 344-350). Society of Photo-Optical Instrumentation Engineers.

High peak power pulse laser for laser induced breakdown. / Ueda, Toshisugu; Wakamatsu, Muneaki; Tomosada, Nobuhiro; Hayashi, Hisanori; Sugiyama, Tadashi; Yagi, Takashi; Ohmae, Goichi.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3889 Society of Photo-Optical Instrumentation Engineers, 2000. p. 344-350.

Research output: Chapter in Book/Report/Conference proceedingChapter

Ueda, T, Wakamatsu, M, Tomosada, N, Hayashi, H, Sugiyama, T, Yagi, T & Ohmae, G 2000, High peak power pulse laser for laser induced breakdown. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3889, Society of Photo-Optical Instrumentation Engineers, pp. 344-350, Advanced High-Power Lasers, Osaka, Jpn, 99/11/1.
Ueda T, Wakamatsu M, Tomosada N, Hayashi H, Sugiyama T, Yagi T et al. High peak power pulse laser for laser induced breakdown. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3889. Society of Photo-Optical Instrumentation Engineers. 2000. p. 344-350
Ueda, Toshisugu ; Wakamatsu, Muneaki ; Tomosada, Nobuhiro ; Hayashi, Hisanori ; Sugiyama, Tadashi ; Yagi, Takashi ; Ohmae, Goichi. / High peak power pulse laser for laser induced breakdown. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3889 Society of Photo-Optical Instrumentation Engineers, 2000. pp. 344-350
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