High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3

K. E. Lipinska-Kalita, B. Chen, M. B. Kruger, Yoshimichi Ohki, J. Murowchick, E. P. Gogol

    Research output: Contribution to journalArticle

    25 Citations (Scopus)

    Abstract

    Synchrotron-radiation-based, energy-dispersive x-ray -diffraction studies have been performed on a composite containing nanometer-size aggregates embedded in an amorphous matrix, in the pressure range from ambient up to 15 GPa. The optically transparent material containing β-Ga2O 3 nanocrystals was developed by the controlled crystallization of a silicon oxide-based amorphous precursor. Transmission electron microscopy and conventional x-ray-diffraction techniques allowed estimating the mean size of a single-crystalline phase to be 14.8±1.9 nm, distributed homogeneously in an amorphous medium. The pressure-driven evolution of x-ray-diffraction patterns indicated a progressive densification of the nanocrystalline phase. Astructural modification corresponding to a pressure-induced coordination change of the gallium atoms was evidenced by the appearance of new diffraction peaks. The overall changes of x-ray-diffraction patterns indicated a β-Ga2O3 to α-Ga2O3 phase transformation. The low- to high-density phase transition was initiated at around 6 GPa and not completed in the pressure range investigated. A Birch-Murnaghan fit of the unit-cell volume change as a function of pressure yielded a zero-pressure bulk modulus, K0, for the nanocrystalline phase of 191. ±4.9 GPa and its pressure derivative, K0′ =8.3±0.9.

    Original languageEnglish
    Article number035209
    Pages (from-to)352091-352098
    Number of pages8
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Volume68
    Issue number3
    Publication statusPublished - 2003 Jul

    Fingerprint

    Glass ceramics
    x ray diffraction
    Diffraction
    X rays
    Diffraction patterns
    diffraction patterns
    Phase transitions
    Gallium
    transparence
    Silicon oxides
    densification
    Crystallization
    Synchrotron radiation
    silicon oxides
    bulk modulus
    Densification
    Nanocrystals
    gallium
    phase transformations
    nanocrystals

    ASJC Scopus subject areas

    • Condensed Matter Physics

    Cite this

    Lipinska-Kalita, K. E., Chen, B., Kruger, M. B., Ohki, Y., Murowchick, J., & Gogol, E. P. (2003). High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3 Physical Review B - Condensed Matter and Materials Physics, 68(3), 352091-352098. [035209].

    High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3 . / Lipinska-Kalita, K. E.; Chen, B.; Kruger, M. B.; Ohki, Yoshimichi; Murowchick, J.; Gogol, E. P.

    In: Physical Review B - Condensed Matter and Materials Physics, Vol. 68, No. 3, 035209, 07.2003, p. 352091-352098.

    Research output: Contribution to journalArticle

    Lipinska-Kalita, KE, Chen, B, Kruger, MB, Ohki, Y, Murowchick, J & Gogol, EP 2003, 'High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3 ', Physical Review B - Condensed Matter and Materials Physics, vol. 68, no. 3, 035209, pp. 352091-352098.
    Lipinska-Kalita, K. E. ; Chen, B. ; Kruger, M. B. ; Ohki, Yoshimichi ; Murowchick, J. ; Gogol, E. P. / High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3 In: Physical Review B - Condensed Matter and Materials Physics. 2003 ; Vol. 68, No. 3. pp. 352091-352098.
    @article{b7dc7d508db9488cb4ffe85779d6789f,
    title = "High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3",
    abstract = "Synchrotron-radiation-based, energy-dispersive x-ray -diffraction studies have been performed on a composite containing nanometer-size aggregates embedded in an amorphous matrix, in the pressure range from ambient up to 15 GPa. The optically transparent material containing β-Ga2O 3 nanocrystals was developed by the controlled crystallization of a silicon oxide-based amorphous precursor. Transmission electron microscopy and conventional x-ray-diffraction techniques allowed estimating the mean size of a single-crystalline phase to be 14.8±1.9 nm, distributed homogeneously in an amorphous medium. The pressure-driven evolution of x-ray-diffraction patterns indicated a progressive densification of the nanocrystalline phase. Astructural modification corresponding to a pressure-induced coordination change of the gallium atoms was evidenced by the appearance of new diffraction peaks. The overall changes of x-ray-diffraction patterns indicated a β-Ga2O3 to α-Ga2O3 phase transformation. The low- to high-density phase transition was initiated at around 6 GPa and not completed in the pressure range investigated. A Birch-Murnaghan fit of the unit-cell volume change as a function of pressure yielded a zero-pressure bulk modulus, K0, for the nanocrystalline phase of 191. ±4.9 GPa and its pressure derivative, K0′ =8.3±0.9.",
    author = "Lipinska-Kalita, {K. E.} and B. Chen and Kruger, {M. B.} and Yoshimichi Ohki and J. Murowchick and Gogol, {E. P.}",
    year = "2003",
    month = "7",
    language = "English",
    volume = "68",
    pages = "352091--352098",
    journal = "Physical Review B-Condensed Matter",
    issn = "0163-1829",
    publisher = "American Institute of Physics Publising LLC",
    number = "3",

    }

    TY - JOUR

    T1 - High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3

    AU - Lipinska-Kalita, K. E.

    AU - Chen, B.

    AU - Kruger, M. B.

    AU - Ohki, Yoshimichi

    AU - Murowchick, J.

    AU - Gogol, E. P.

    PY - 2003/7

    Y1 - 2003/7

    N2 - Synchrotron-radiation-based, energy-dispersive x-ray -diffraction studies have been performed on a composite containing nanometer-size aggregates embedded in an amorphous matrix, in the pressure range from ambient up to 15 GPa. The optically transparent material containing β-Ga2O 3 nanocrystals was developed by the controlled crystallization of a silicon oxide-based amorphous precursor. Transmission electron microscopy and conventional x-ray-diffraction techniques allowed estimating the mean size of a single-crystalline phase to be 14.8±1.9 nm, distributed homogeneously in an amorphous medium. The pressure-driven evolution of x-ray-diffraction patterns indicated a progressive densification of the nanocrystalline phase. Astructural modification corresponding to a pressure-induced coordination change of the gallium atoms was evidenced by the appearance of new diffraction peaks. The overall changes of x-ray-diffraction patterns indicated a β-Ga2O3 to α-Ga2O3 phase transformation. The low- to high-density phase transition was initiated at around 6 GPa and not completed in the pressure range investigated. A Birch-Murnaghan fit of the unit-cell volume change as a function of pressure yielded a zero-pressure bulk modulus, K0, for the nanocrystalline phase of 191. ±4.9 GPa and its pressure derivative, K0′ =8.3±0.9.

    AB - Synchrotron-radiation-based, energy-dispersive x-ray -diffraction studies have been performed on a composite containing nanometer-size aggregates embedded in an amorphous matrix, in the pressure range from ambient up to 15 GPa. The optically transparent material containing β-Ga2O 3 nanocrystals was developed by the controlled crystallization of a silicon oxide-based amorphous precursor. Transmission electron microscopy and conventional x-ray-diffraction techniques allowed estimating the mean size of a single-crystalline phase to be 14.8±1.9 nm, distributed homogeneously in an amorphous medium. The pressure-driven evolution of x-ray-diffraction patterns indicated a progressive densification of the nanocrystalline phase. Astructural modification corresponding to a pressure-induced coordination change of the gallium atoms was evidenced by the appearance of new diffraction peaks. The overall changes of x-ray-diffraction patterns indicated a β-Ga2O3 to α-Ga2O3 phase transformation. The low- to high-density phase transition was initiated at around 6 GPa and not completed in the pressure range investigated. A Birch-Murnaghan fit of the unit-cell volume change as a function of pressure yielded a zero-pressure bulk modulus, K0, for the nanocrystalline phase of 191. ±4.9 GPa and its pressure derivative, K0′ =8.3±0.9.

    UR - http://www.scopus.com/inward/record.url?scp=0345602002&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=0345602002&partnerID=8YFLogxK

    M3 - Article

    AN - SCOPUS:0345602002

    VL - 68

    SP - 352091

    EP - 352098

    JO - Physical Review B-Condensed Matter

    JF - Physical Review B-Condensed Matter

    SN - 0163-1829

    IS - 3

    M1 - 035209

    ER -