High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3

K. E. Lipinska-Kalita, B. Chen, M. B. Kruger, Y. Ohki, J. Murowchick, E. P. Gogol

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Abstract

Synchrotron-radiation-based, energy-dispersive x-ray -diffraction studies have been performed on a composite containing nanometer-size aggregates embedded in an amorphous matrix, in the pressure range from ambient up to 15 GPa. The optically transparent material containing β-Ga2O 3 nanocrystals was developed by the controlled crystallization of a silicon oxide-based amorphous precursor. Transmission electron microscopy and conventional x-ray-diffraction techniques allowed estimating the mean size of a single-crystalline phase to be 14.8±1.9 nm, distributed homogeneously in an amorphous medium. The pressure-driven evolution of x-ray-diffraction patterns indicated a progressive densification of the nanocrystalline phase. Astructural modification corresponding to a pressure-induced coordination change of the gallium atoms was evidenced by the appearance of new diffraction peaks. The overall changes of x-ray-diffraction patterns indicated a β-Ga2O3 to α-Ga2O3 phase transformation. The low- to high-density phase transition was initiated at around 6 GPa and not completed in the pressure range investigated. A Birch-Murnaghan fit of the unit-cell volume change as a function of pressure yielded a zero-pressure bulk modulus, K0, for the nanocrystalline phase of 191. ±4.9 GPa and its pressure derivative, K0′ =8.3±0.9.

Original languageEnglish
Article number035209
Pages (from-to)352091-352098
Number of pages8
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume68
Issue number3
Publication statusPublished - 2003 Jul 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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    Lipinska-Kalita, K. E., Chen, B., Kruger, M. B., Ohki, Y., Murowchick, J., & Gogol, E. P. (2003). High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3. Physical Review B - Condensed Matter and Materials Physics, 68(3), 352091-352098. [035209].