High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3

E. Lipinska-Kalita, B. Chen, B. Kruger, Yoshimichi Ohki, J. Murowchick, P. Gogol

    Research output: Contribution to journalArticle

    1 Citation (Scopus)

    Abstract

    Synchrotron-radiation-based, energy-dispersive x-ray-diffraction studies have been performed on a composite containing nanometer-size aggregates embedded in an amorphous matrix, in the pressure range from ambient up to 15 GPa. The optically transparent material containing β-Ga2O3 nanocrystals was developed by the controlled crystallization of a silicon oxide-based amorphous precursor. Transmission electron microscopy and conventional x-ray-diffraction techniques allowed estimating the mean size of a single-crystalline phase to be 14.8±1.9 nm, distributed homogeneously in an amorphous medium. The pressure-driven evolution of x-ray-diffraction patterns indicated a progressive densification of the nanocrystalline phase. A structural modification corresponding to a pressure-induced coordination change of the gallium atoms was evidenced by the appearance of new diffraction peaks. The overall changes of x-ray-diffraction patterns indicated a β-Ga2O3 to α-Ga2O3 phase transformation. The low- to high-density phase transition was initiated at around 6 GPa and not completed in the pressure range investigated. A Birch-Murnaghan fit of the unit-cell volume change as a function of pressure yielded a zero-pressure bulk modulus, K0, for the nanocrystalline phase of 191±4.9 GPa and its pressure derivative, K0′=8.3±0.9.

    Original languageEnglish
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Volume68
    Issue number11
    DOIs
    Publication statusPublished - 2003 Jul 15

    Fingerprint

    Glass ceramics
    x ray diffraction
    Diffraction
    X rays
    Diffraction patterns
    diffraction patterns
    Phase transitions
    Gallium
    transparence
    Silicon oxides
    densification
    Crystallization
    Synchrotron radiation
    silicon oxides
    bulk modulus
    Densification
    Nanocrystals
    gallium
    phase transformations
    nanocrystals

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

    Cite this

    High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3 . / Lipinska-Kalita, E.; Chen, B.; Kruger, B.; Ohki, Yoshimichi; Murowchick, J.; Gogol, P.

    In: Physical Review B - Condensed Matter and Materials Physics, Vol. 68, No. 11, 15.07.2003.

    Research output: Contribution to journalArticle

    @article{2fd1fc4e7291437d95f6b445d55224a6,
    title = "High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3",
    abstract = "Synchrotron-radiation-based, energy-dispersive x-ray-diffraction studies have been performed on a composite containing nanometer-size aggregates embedded in an amorphous matrix, in the pressure range from ambient up to 15 GPa. The optically transparent material containing β-Ga2O3 nanocrystals was developed by the controlled crystallization of a silicon oxide-based amorphous precursor. Transmission electron microscopy and conventional x-ray-diffraction techniques allowed estimating the mean size of a single-crystalline phase to be 14.8±1.9 nm, distributed homogeneously in an amorphous medium. The pressure-driven evolution of x-ray-diffraction patterns indicated a progressive densification of the nanocrystalline phase. A structural modification corresponding to a pressure-induced coordination change of the gallium atoms was evidenced by the appearance of new diffraction peaks. The overall changes of x-ray-diffraction patterns indicated a β-Ga2O3 to α-Ga2O3 phase transformation. The low- to high-density phase transition was initiated at around 6 GPa and not completed in the pressure range investigated. A Birch-Murnaghan fit of the unit-cell volume change as a function of pressure yielded a zero-pressure bulk modulus, K0, for the nanocrystalline phase of 191±4.9 GPa and its pressure derivative, K0′=8.3±0.9.",
    author = "E. Lipinska-Kalita and B. Chen and B. Kruger and Yoshimichi Ohki and J. Murowchick and P. Gogol",
    year = "2003",
    month = "7",
    day = "15",
    doi = "10.1103/PhysRevB.68.035209",
    language = "English",
    volume = "68",
    journal = "Physical Review B-Condensed Matter",
    issn = "0163-1829",
    publisher = "American Institute of Physics Publising LLC",
    number = "11",

    }

    TY - JOUR

    T1 - High-pressure x-ray diffraction studies of the nanostructured transparent vitroceramic medium K2O-SiO2-Ga2O3

    AU - Lipinska-Kalita, E.

    AU - Chen, B.

    AU - Kruger, B.

    AU - Ohki, Yoshimichi

    AU - Murowchick, J.

    AU - Gogol, P.

    PY - 2003/7/15

    Y1 - 2003/7/15

    N2 - Synchrotron-radiation-based, energy-dispersive x-ray-diffraction studies have been performed on a composite containing nanometer-size aggregates embedded in an amorphous matrix, in the pressure range from ambient up to 15 GPa. The optically transparent material containing β-Ga2O3 nanocrystals was developed by the controlled crystallization of a silicon oxide-based amorphous precursor. Transmission electron microscopy and conventional x-ray-diffraction techniques allowed estimating the mean size of a single-crystalline phase to be 14.8±1.9 nm, distributed homogeneously in an amorphous medium. The pressure-driven evolution of x-ray-diffraction patterns indicated a progressive densification of the nanocrystalline phase. A structural modification corresponding to a pressure-induced coordination change of the gallium atoms was evidenced by the appearance of new diffraction peaks. The overall changes of x-ray-diffraction patterns indicated a β-Ga2O3 to α-Ga2O3 phase transformation. The low- to high-density phase transition was initiated at around 6 GPa and not completed in the pressure range investigated. A Birch-Murnaghan fit of the unit-cell volume change as a function of pressure yielded a zero-pressure bulk modulus, K0, for the nanocrystalline phase of 191±4.9 GPa and its pressure derivative, K0′=8.3±0.9.

    AB - Synchrotron-radiation-based, energy-dispersive x-ray-diffraction studies have been performed on a composite containing nanometer-size aggregates embedded in an amorphous matrix, in the pressure range from ambient up to 15 GPa. The optically transparent material containing β-Ga2O3 nanocrystals was developed by the controlled crystallization of a silicon oxide-based amorphous precursor. Transmission electron microscopy and conventional x-ray-diffraction techniques allowed estimating the mean size of a single-crystalline phase to be 14.8±1.9 nm, distributed homogeneously in an amorphous medium. The pressure-driven evolution of x-ray-diffraction patterns indicated a progressive densification of the nanocrystalline phase. A structural modification corresponding to a pressure-induced coordination change of the gallium atoms was evidenced by the appearance of new diffraction peaks. The overall changes of x-ray-diffraction patterns indicated a β-Ga2O3 to α-Ga2O3 phase transformation. The low- to high-density phase transition was initiated at around 6 GPa and not completed in the pressure range investigated. A Birch-Murnaghan fit of the unit-cell volume change as a function of pressure yielded a zero-pressure bulk modulus, K0, for the nanocrystalline phase of 191±4.9 GPa and its pressure derivative, K0′=8.3±0.9.

    UR - http://www.scopus.com/inward/record.url?scp=85039002883&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=85039002883&partnerID=8YFLogxK

    U2 - 10.1103/PhysRevB.68.035209

    DO - 10.1103/PhysRevB.68.035209

    M3 - Article

    AN - SCOPUS:85039002883

    VL - 68

    JO - Physical Review B-Condensed Matter

    JF - Physical Review B-Condensed Matter

    SN - 0163-1829

    IS - 11

    ER -