High-resolution CdTe detector and applications to imaging devices

Tadayuki Takahashi, Shin Watanabe, Manabu Kouda, Goro Sato, Yuu Okada, Shin Kubo, Yoshikatsu Kuroda, Mitsunobu Onishi, Ryoichi Ohno

Research output: Contribution to journalArticle

91 Citations (Scopus)

Abstract

Using a high quality Cadmium Telluride (CdTe) wafer, we formed a Schottky junction and operated the detector as a diode (CdTe diode). The low leakage current of the CdTe diode allows us to apply a much higher bias voltage than was possible with the previous CdTe detectors. For a relatively thin detector of ∼ 0.5 mm thick, the high bias voltage results in a high electric field in the device. Both the improved charge collection efficiency and the low-leakage current lead to an energy resolution of 1.1 keV FWHM at 60 keV for a 2 × 2 mm2 device and 2 keV for a 10 × 10 mm2 device at 5 °C without any charge-loss correction electronics. For astrophysical applications, we have developed an initial prototype CdTe pixel detector based on the CdTe diode. The detector has 400 pixels with a pixel size of 625 × 625 μm2. Each pixel is gold-stud bonded to a fanout board and routed to a front end ASIC to measure pulse height information for each γ-ray photon.

Original languageEnglish
Pages (from-to)287-291
Number of pages5
JournalIEEE Transactions on Nuclear Science
Volume48
Issue number3 I
DOIs
Publication statusPublished - 2001 Jun

Fingerprint

Cadmium telluride
cadmium tellurides
Detectors
Imaging techniques
high resolution
detectors
Diodes
Pixels
pixels
diodes
Bias voltage
Leakage currents
leakage
application specific integrated circuits
electric potential
pulse amplitude
Application specific integrated circuits
Full width at half maximum
rays
astrophysics

Keywords

  • CdTe
  • CdZnTe
  • Pixel detector

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering

Cite this

Takahashi, T., Watanabe, S., Kouda, M., Sato, G., Okada, Y., Kubo, S., ... Ohno, R. (2001). High-resolution CdTe detector and applications to imaging devices. IEEE Transactions on Nuclear Science, 48(3 I), 287-291. https://doi.org/10.1109/23.940067

High-resolution CdTe detector and applications to imaging devices. / Takahashi, Tadayuki; Watanabe, Shin; Kouda, Manabu; Sato, Goro; Okada, Yuu; Kubo, Shin; Kuroda, Yoshikatsu; Onishi, Mitsunobu; Ohno, Ryoichi.

In: IEEE Transactions on Nuclear Science, Vol. 48, No. 3 I, 06.2001, p. 287-291.

Research output: Contribution to journalArticle

Takahashi, T, Watanabe, S, Kouda, M, Sato, G, Okada, Y, Kubo, S, Kuroda, Y, Onishi, M & Ohno, R 2001, 'High-resolution CdTe detector and applications to imaging devices', IEEE Transactions on Nuclear Science, vol. 48, no. 3 I, pp. 287-291. https://doi.org/10.1109/23.940067
Takahashi T, Watanabe S, Kouda M, Sato G, Okada Y, Kubo S et al. High-resolution CdTe detector and applications to imaging devices. IEEE Transactions on Nuclear Science. 2001 Jun;48(3 I):287-291. https://doi.org/10.1109/23.940067
Takahashi, Tadayuki ; Watanabe, Shin ; Kouda, Manabu ; Sato, Goro ; Okada, Yuu ; Kubo, Shin ; Kuroda, Yoshikatsu ; Onishi, Mitsunobu ; Ohno, Ryoichi. / High-resolution CdTe detector and applications to imaging devices. In: IEEE Transactions on Nuclear Science. 2001 ; Vol. 48, No. 3 I. pp. 287-291.
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