High resolution CdTe detector and applications to imaging devices

Tadayuki Takahashi, Shin Watanabe, Goro Sato, Yuu Okada, Shin Kubo, Yoshikatsu Kuroda, Mitsunobu Onishi, Ryoichi Ohno

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Using a high quality Cadmium Telluride (CdTe) wafer, we formed a Schottky junction and operated the detector as a diode (CdTe diode). The low leakage current of the CdTe diode allows us to apply a much higher bias voltage than was possible with the previous CdTe detectors. For a relatively thin detector of ≈ 0.5 mm thick, the high bias voltage results in a high electric field in the device. Both the improved charge collection efficiency and the low-leakage current lead to an energy resolution of 1.1 keV FWHM at 60 keV for a 2×2 mm2 device and 2 keV for a 10×10 mm2 device at 5°C without any charge-loss correction electronics. For astrophysical applications, we have developed a an initial prototype CdTe pixel detector based on the CdTe diode. The detector has 400 pixels with a pixel size of 625 × 625 μ2. Each pixel is gold-stud bonded to a fanout board and routed to a front end ASIC to measure pulse height information for each γ-ray photon.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposium and Medical Imaging Conference
EditorsD. Merelli, J. Surget, M. Ulma
Volume1
Publication statusPublished - 2000
Event2000 IEEE Nuclear Science Symposium Conference Record - Lyon
Duration: 2000 Oct 152000 Oct 20

Other

Other2000 IEEE Nuclear Science Symposium Conference Record
CityLyon
Period00/10/1500/10/20

Fingerprint

Cadmium telluride
Detectors
Imaging techniques
Diodes
Pixels
Bias voltage
Leakage currents
Application specific integrated circuits
Full width at half maximum
Electronic equipment
Photons
Gold
Electric fields

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

Cite this

Takahashi, T., Watanabe, S., Sato, G., Okada, Y., Kubo, S., Kuroda, Y., ... Ohno, R. (2000). High resolution CdTe detector and applications to imaging devices. In D. Merelli, J. Surget, & M. Ulma (Eds.), IEEE Nuclear Science Symposium and Medical Imaging Conference (Vol. 1)

High resolution CdTe detector and applications to imaging devices. / Takahashi, Tadayuki; Watanabe, Shin; Sato, Goro; Okada, Yuu; Kubo, Shin; Kuroda, Yoshikatsu; Onishi, Mitsunobu; Ohno, Ryoichi.

IEEE Nuclear Science Symposium and Medical Imaging Conference. ed. / D. Merelli; J. Surget; M. Ulma. Vol. 1 2000.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Takahashi, T, Watanabe, S, Sato, G, Okada, Y, Kubo, S, Kuroda, Y, Onishi, M & Ohno, R 2000, High resolution CdTe detector and applications to imaging devices. in D Merelli, J Surget & M Ulma (eds), IEEE Nuclear Science Symposium and Medical Imaging Conference. vol. 1, 2000 IEEE Nuclear Science Symposium Conference Record, Lyon, 00/10/15.
Takahashi T, Watanabe S, Sato G, Okada Y, Kubo S, Kuroda Y et al. High resolution CdTe detector and applications to imaging devices. In Merelli D, Surget J, Ulma M, editors, IEEE Nuclear Science Symposium and Medical Imaging Conference. Vol. 1. 2000
Takahashi, Tadayuki ; Watanabe, Shin ; Sato, Goro ; Okada, Yuu ; Kubo, Shin ; Kuroda, Yoshikatsu ; Onishi, Mitsunobu ; Ohno, Ryoichi. / High resolution CdTe detector and applications to imaging devices. IEEE Nuclear Science Symposium and Medical Imaging Conference. editor / D. Merelli ; J. Surget ; M. Ulma. Vol. 1 2000.
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