High resolution Schottky CdTe diode detector

Tadayuki Takahashi, Takefumi Mitani, Yoshihito Kobayashi, Manabu Kouda, Goro Sato, Shin Watanabe, Kazuhiro Nakazawa, Yuu Okada, Minoru Funaki, Ryoichi Ohno, Kunishiro Mori

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

We describe recent progress on the use of Schottky CdTe diode detectors for spectrometry. The low leakage current of the CdTe diode allows us to apply a much higher bias voltage than was possible with previous CdTe detectors. For a relatively thin detector of 0.5-1 mm thick, the high bias voltage results in a high electric field in the device. Both the improved charge collection efficiency and the low-leakage current lead to an energy resolution of better than 600 eV FWHM at 60 keV for a 2×2 mm 2 device without any charge-loss correction electronics. Large area detectors with dimensions of 21×21 mm 2 are now available with an energy resolution of ∼2.8 keV. Long term stability can be easily attained for relatively thin (< 1 mm) detectors, if they are cooled or operated under a high bias voltage.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposium and Medical Imaging Conference
Pages2464-2468
Number of pages5
Volume4
Publication statusPublished - 2002
Event2001 IEEE Nuclear Science Symposium Conference Record - San Diego, CA
Duration: 2001 Nov 42001 Nov 10

Other

Other2001 IEEE Nuclear Science Symposium Conference Record
CitySan Diego, CA
Period01/11/401/11/10

Fingerprint

Diodes
Detectors
Bias voltage
Leakage currents
Full width at half maximum
Spectrometry
Electronic equipment
Electric fields

Keywords

  • CdTe
  • CdZnTe
  • Pixel detector

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

Cite this

Takahashi, T., Mitani, T., Kobayashi, Y., Kouda, M., Sato, G., Watanabe, S., ... Mori, K. (2002). High resolution Schottky CdTe diode detector. In IEEE Nuclear Science Symposium and Medical Imaging Conference (Vol. 4, pp. 2464-2468)

High resolution Schottky CdTe diode detector. / Takahashi, Tadayuki; Mitani, Takefumi; Kobayashi, Yoshihito; Kouda, Manabu; Sato, Goro; Watanabe, Shin; Nakazawa, Kazuhiro; Okada, Yuu; Funaki, Minoru; Ohno, Ryoichi; Mori, Kunishiro.

IEEE Nuclear Science Symposium and Medical Imaging Conference. Vol. 4 2002. p. 2464-2468.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Takahashi, T, Mitani, T, Kobayashi, Y, Kouda, M, Sato, G, Watanabe, S, Nakazawa, K, Okada, Y, Funaki, M, Ohno, R & Mori, K 2002, High resolution Schottky CdTe diode detector. in IEEE Nuclear Science Symposium and Medical Imaging Conference. vol. 4, pp. 2464-2468, 2001 IEEE Nuclear Science Symposium Conference Record, San Diego, CA, 01/11/4.
Takahashi T, Mitani T, Kobayashi Y, Kouda M, Sato G, Watanabe S et al. High resolution Schottky CdTe diode detector. In IEEE Nuclear Science Symposium and Medical Imaging Conference. Vol. 4. 2002. p. 2464-2468
Takahashi, Tadayuki ; Mitani, Takefumi ; Kobayashi, Yoshihito ; Kouda, Manabu ; Sato, Goro ; Watanabe, Shin ; Nakazawa, Kazuhiro ; Okada, Yuu ; Funaki, Minoru ; Ohno, Ryoichi ; Mori, Kunishiro. / High resolution Schottky CdTe diode detector. IEEE Nuclear Science Symposium and Medical Imaging Conference. Vol. 4 2002. pp. 2464-2468
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AU - Watanabe, Shin

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